Programme Reliability in Power Electronics

Transcription

1 Programme Reliability in Power Electronics CORPE Annual Symposium no. 3 Center of Reliable Power Electronics Wednesday, November 19 th 2014 Location: Aalborg University, Department of Energy Technology Fibigerstraede 16, DK-9220 Aalborg East, Denmark, room (Aud.), 1 st Floor The objective of the annual symposium is to get an update on CORPE, and focus on open presentations and discussions about the research in CORPE. At first international recognized speakers within the CORPE research field will present their point of views, and afterwards results, future activities in CORPE will be discussed. The symposium is free of charge (with a fee for no-show) and open for stakeholders, companies and other with an interest in the field of reliability and power electronics. To register, click here 08:00 09:00 Coffee, Networking and Registration 09:00 09:10 Welcome and a short introduction to CORPE by Dr. Frede Blaabjerg, Leader CORPE, Aalborg University, Denmark 09:10 09:45 The Era of Designing Parasitics - by Dr. Eckart Hoene, Fraunhofer, IZM, Berlin, Germany 09:45 10:20 Thermal manager and junction temperature control for IGBT life time on power converters by Dr. Vladimir Blasko, United Technologies Research Center, United States 10:20 10:35 Break and coffee 10:35 11:10 From mission profile to robust wind turbines state of the art and challenges by Dr. Tusitha Abeyasekera, Vestas, Denmark 11:10 11:45 Prognostic Health Management of Aircraft Electronics/Power Electronics by Dr. Suresh Perinpanayagam, Boeing Prognostic Center, Cranfield University, United Kingdom 11:45 13:30 Lunch and Poster Session Posters from CORPE PhD s in PDF format will be available a week before the symposium 13:30 15:00 CORPE activities (Selected presentations) 13:30 13:45 Dynamic 3D Modelling of Thermo-Mechanical Degradation in IGBT Modules by PhD Student Kristian Pedersen, Department of Physics and Nanotechnology, Aalborg University 13:45 14:00 Life Time Modelling of Capacitors by Assistant Professor Huai Wang, Department of Energy Technology, Aalborg University

2 14:00 14:15 Mission Profile based Analysis Tool for Reliability studies by Assistant Professor Ke Ma, Department of Energy Technology, Aalborg University 14:15 14:30 Smart Monitoring of IGBT Modules by PhD Student Pramod Ghimire, Department of Energy Technology, Aalborg University 14:30 14:45 Wide Bandgap Medium Voltage Power Modules by Professor Stig Munk- Nielsen, Department of Energy Technology, Aalborg University 14:45 15:00 Semiconductor Materials for Power Electronics by Professor and Head of Department, Department of Physics and Nanotechnology, Aalborg University 15:00 15:30 CORPE overview and future by Center Leader, Frede Blaabjerg, Department of Energy Technology, Aalborg University 15:30 17:00 Visit to CORPE Infrastructure Pontoppidanstraede 115 and Skjernvej 4A, 9220 Aalborg East 17:00 End of day AAU-1-DAY wireless network passwords: Will be available on the day Price: Free of charge but with a fee for no-show at DKK 800,00 (cancellation no later than November 12 th 2014) Last day of registration: November 12 th 2014 at the latest Link for accommodation in Aalborg: About CORPE Center of Reliable Power Electronics (CORPE) at Aalborg University, Denmark, inaugurated in 2012, aiming to design more reliable and more efficient power electronic systems for use in equipment for power generation, distribution and consumption. The center address a better understanding of how reliability of power electronic devices and systems is influenced by different stress factors such as temperature, overvoltage and current, overload, humidity and other environmental factors. The center is established in close collaboration with major Danish power electronic companies and Aarhus University with collaboration with two leading European universities. Further, the center develop device and system models that will enable simulation and design of power electronic systems very close to the limits of the devices and enable designed reliability. The knowledge will also be used online during operation to predict lifetime and enable smart derating of the power electronics equipment still in operation and ensure longer lifetime. A number of advanced test systems are available in CORPE. More than 30 researchers are active (around 15 PhD s) at universities and companies. The center is supported by the Danish Strategic Research Council and the Obel Foundation. We are looking forward to seeing you in Aalborg Best Regards, Frede Blaabjerg fbl@et.aau.dk

3 Maps Aalborg University, Department of Energy Technology Fibigerstraede 16, 1st floor, room Aud Aalborg East Aalborg University, Department of Physics and Nanotechnology, Skjernvej 4A, 9220 Aalborg East

4 Poster Session Presentations by the PhD students within CORPE funding: Morten Arnfeldt Hygum Rui Wu Kristian Bonderup Pedersen Uimin Choi Dennis Achton Nielsen Amir Sajjad Bahman Nicolae-Cristian Sintamarean Pramod Ghimire Paula Diaz Reigosa Sanjay Chaudhury (Assistant Professor) Correlation between environmental related failures and reliability in power electronics Multi-Physics Based Modeling of Power Electronic Components and Circuits Physics of Failure Based Quality and Reliability Investigation Modeling of real-world stress in Power Semiconductor Devices Physical characterization of film capacitors for power electronics Multidisciplinary Design Tool for Power Circuits Emerging Power Electronics Devices and Circuit Design Real Time Measurement and Life Time Prediction Methods of Power Modules Evidence of oscillations during short circuit assessment of parallel modules Field Data Logger for Recording Mission Profiles of Power Converters Presentations by the PhD student within the CORPE field (other funding activities): Yongheng Yang Dao Zhou Zian Qin Nick Baker Hammam Abdelaal Hammam Soliman Brwene Salah Abdelkarim Gadalla Mission Profile based Multi-Disciplinary Analysis of Power Modules in Single-Phase Transformerless PV Inverters Reliability and Energy Loss in Full-scale Wind Power Converter Considering Grid Codes and Wind Classes Power Loss Benchmark of Nine-Switch Converters in Three-phase Online-UPS Application Online junction temperature measurement using Internal Gate Resistance Condition Monitoring of Capacitors for DC-Link Application in Power Electronic Converters Thermal Investigation of Buck-Boost Power Converters

5 Eckart Hoene Abstract: As Power Electronics has reached a very high performance level already, major improvements are intended to reduce costs, depending on the application either in investment or in maintenance. Maintenance is directly related to reliability, where the influencing factors besides the semiconductors and their losses are packaging technologies and cooling. The investment costs are relevant for high volume products, here number and cost of components have to be reduced. The presentation picks out these two aspects out of the activities at the Fraunhofer IZM: Packaging technologies for higher reliability and the package requirements for fast switching. The first one gives an overview on interesting candidates for future packages, the second one gives an insight on opportunities and required changes for faster switching. The experience in this area gave the inspiration for the title: Era of designing parasitics Biography: Title: Prof. Dr.-Ing. Eckart Hoene Business Development Manager Power Group Leader Power Fraunhofer IZM Year of birth 1970 Education Study of drive engineering at TU-Berlin 2000 PhD: Predicting EMI behavior of drive systems Professional career Scientific assistant Fraunhofer IZM 2000 Postdoc at IZM Since 2006 Group leader of now 10 Scientists 2012 Business development manager Power 2014 Adjunct professor at Aalborg University Topics of work Fast switching semiconductors, EMC, Packaging and Prototype development for Power Electronics Mr. Hoene holds 5 Patents Contact Fraunhofer IZM Prof. Dr.-Ing. Eckart Hoene Gustav-Meyer-Allee Berlin Tel.: (030) eckart.hoene@izm.fraunhofer.de

6 Vladimir Blasko Abstract: The dissipated power and junction temperatures of free wheel diodes and IGBTs in the power modules of a Voltage Source Converter were estimated. The complexity and accuracy of the thermal dynamic models of semiconductor devices diodes and transistors was analyzed. It was found that the third order dynamical thermal model was accurate enough and suitable for modeling of power devices. The method for deriving model parameters from manufacturer s data sheets was developed and verified. Models of the power circuit devices, IGBT's and diodes, together with a heat sink model were combined into dynamical thermal model of 3-phase Inverter Bridge. The model, together with thermal management strategy was implemented in a microprocessor for on line junction temperature control. Biography: Dr. Vladimir Blasko, holds the position of a Senior Fellow at United Technologies Research Center where he formed and lead Power Electronics Systems group. Until 2007, he was with Otis Elevator Company where he initiated and lead development of a new generation of high performance regenerative drives. Before joining Otis he was with Rockwell Automation-Allen Bradley Company for seven and a half years working on research and advanced drives development. For the twelve years prior to that, he was at the Research Institute of Koncar Company Zagreb, Croatia in Automatic Control and Power Electronics department. During the academic year of as the recipient of IREX scholarship, he was a Postdoctoral Fellow at the University of Wisconsin Madison. His primary areas of research interest are power electronics, modern AC drives, distributed energy systems, intelligent power management, and applied modern control theory and technology. Dr. Blasko published more than 40 papers and holds more than 20 patents; he is IEEE Fellow, Adjunct Professor at the University of Wisconsin Madison and Adjunct Professor of Electrical Engineering at the University of Zagreb, Croatia and a member of Connecticut Academy of Science and Engineering.

7 Tusitha Abeyasekera Abstract: Dr Tusitha Abeyasekera received his MSc in Electromechanical Engineering from Kiev Poltechnic Institute and PhD in Electrical Engineering from Newcastle University, UK. From he was a Research Associate at the Univeristy of Newcastle, investigating into real time performance of wind turbines under fault scenarios. Since 2007 he has been employed by Vestas Wind systems, Denmark and has had core design and architect roles in multi MW converter designs for Wind Turbines and is responsible for reliability of power electronics systems. His current research interests are in Reliability of Power electronics for high stress profiles, accelerated lifetime test methods and MW class converter architecture for wind turbines. He is the author/coauthor of numerous patents and publications.

8 Suresh Perinpanayagam Abstract: Prognostic Health Management of Aircraft Electronics/Power Electronics Prognostic Health Monitoring (PHM) is the process of integrating complex systems for monitoring all aspects of vehicles, including structural, propulsion, and electronics. PHM offers the capability to sense, detect, diagnose, and predict imminent degradations or failures in vehicles, thereby allowing the evaluation of the reliability of the systems under real application environments. This talk will focus on investigating the capability of health monitoring techniques to detect degradation of electronic and power electronics in an integrated avionic system. Biography: Dr Suresh Perinpanayagam leads the ephm Group, part of the Boeing Integrated Vehicle Health Management Research Centre set up by The Boeing Company. Suresh has rapidly established a research group, managing 14 researchers (2 research fellows, 6 full-time PhDs, 2 MSc by research and 4 MSc by taught course students) and has obtained grants amounting to 1.4M in total from industrial, EPSRC, TSB and EU-FP7 projects. Suresh obtained his Master in Engineering and PhD in Engineering at Imperial College, London. Suresh has spent considerable time in industry working on various industrial R&D projects. Suresh s vision is to create every electronic system with its own brain to be self-aware of its own health state and to work effectively with other systems to complete a function even if it is not in an optimal state. To realise this, the group develops tools to detect the inception of failures in electronic components and track them to system failures. They also need to correlate the fundamental physics-of-failure work currently done at material science level (for example, solder joint and wire bond failure) to the electronic system data acquired for system health management from data-centric aircrafts, such as Boeing 787. These intelligent electronic systems will inform and reconfigure its health state at different stages of its life. These new systems will redefine the current Built-In Test (BIT) technology in electronic systems with more user-friendly, reduced no-faultfound rate, reduced repair, reduced cost, predictable failures and greater availability for industry. The ephm group has links with many of the UK s high value added electronic system manufacturers, including AEC, Thales, Selex, BAE Systems, Meggitt, GE, Honeywell, Cassidian, General Dynamics, UTC, Raytheon and Visteon Corporation. The group uses this forum to connect fundamental research issues in material, design, manufacturing process, testability, system issues and through-life management of these electronic systems.