SAMTEC POWER CHARACTERIZATION
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1 Project Number: Tracking Code: Power Report Rev 3 Requested by: Eric Mings Date: 9/11/2012 Product Rev: AE Part #: MMSD L D-K-LUS Lot #: «Lot_Number» Tech: Tony Wagoner Eng: Eric Mings Part description: 0.100[0.254] Socket Discrete Cable Assembly Qty to test: 23 Test Start: 6/1/2012 Test Completed: 7/6/2012 SAMTEC POWER CHARACTERIZATION [2.54] Socket Discrete Cable Assembly MMSD L D-K-LUS IPL L-D-K
2 CERTIFICATION All instruments and measuring equipment were calibrated to National Institute for Standards and Technology (NIST) traceable standards according to IS l and ANSI/NCSL , as applicable. All contents contained herein are the property of Samtec. No portion of this report, in part or in full shall be reproduced without prior written approval of Samtec. SCOPE 1. Temperature Rise/Current Carrying Capacity 1.1. To determine the amount of current the device under test (DUT) can safely carry over the operating temperature range of the DUT Contact loading will also be addressed in this document which will determine how much current can be carried as the number of energized contacts is varied. 2. Current Cycling 2.1. To determine the performance of the device under test (DUT) when subjected to the power-on/power-off cycling that heats and cools the DUT in normal everyday use Contact loading will set to 100% throughout the test. APPLICABLE DOCUMENTS Standards: EIA Publication Temperature Rise EIA Publication Contact Resistance EIA Publication Current Cycling TLPM-032 Current Carrying Capacity TLPM-084 Current Cycling IEC Electromechanical Components for Electronic Equipment: Basic Testing Procedures and Measuring Methods, Part 3: Current Carrying Capacity Tests TEST SAMPLES AND PREPARATION 1. All materials shall be manufactured in accordance with the applicable product specification. 2. All test samples shall be identified and encoded to maintain traceability throughout the test sequences. 3. After soldering, the parts to be used shall be cleaned according to TLWI All samples shall be visually inspected and cleaned as necessary. 5. Any additional preparation shall be noted in the individual test sequences. 6. Solder Information: Lead Free 7. Re-Flow Time/Temp: See accompanying profile. 8. All products designed to operate mounted on a printed circuits board shall be tested mounted to test boards in accordance with EIA _Power_Test_Report_Rev_3 2 of 24 5/29/2013
3 PREPARED TEST SAMPLE 9. The following loading configurations shall be tested for Temperature Rise/Current Carrying Capacity testing of two row connector systems: 9.1. Two by One contact energized 9.2. Two by Two contacts energized adjacent to each other 9.3. Two by Three contacts energized adjacent to each other 9.4. Two by Four contacts energized adjacent to each other 9.5. All contacts energized Indicates energized contacts Indicates thermocouple monitored, energized contacts Test Condition as in 10.1 above 10. For Current Cycling, only 100 % loading will be tested. _Power_Test_Report_Rev_3 3 of 24 5/29/2013
4 FLOWCHARTS Current Carrying Capacity 3 Mated Assemblies Each TEST GROUP A GROUP B GROUP C GROUP D GROUP E STEP 3 Mated Assemblies 3 Mated Assemblies 3 Mated Assemblies 3 Mated Assemblies 3 Mated Assemblies 2 CONTACTS POWERED 4 CONTACTS POWERED 6 CONTACTS POWERED 8 CONTACTS POWERED ALL CONTACTS POWERED 01 CCC CCC CCC CCC CCC (TIN PLATING) - Tabulate calculated current at RT, 65 C, 75 C and 95 C after derating 20% and based on 105 C (GOLD PLATING) - Tabulate calculated current at RT, 85 C, 95 C and 115 C after derating 20% and based on 105 C CCC, Temp rise = EIA Current Cycling TEST STEP GROUP A 8 Mated Assembies ALL CONTACTS POWERED 01 Current Cycle, 500 cycles at 125% of Rated current Current Cycle = EIA , Condition "B", Method #4 Test at Current 125% of Rated Current Measure at 45 minutes into ON time of cycle Measure Voltage Drop on 5 random contacts _Power_Test_Report_Rev_3 4 of 24 5/29/2013
5 TEST PROCEDURES Part No. MMSD L D-K-LUS Mating Part No. IPL L-D-K Sample Size 15 Technician Tony Wagoner Start Date 6/1/2012 Complete Date 6/15/2012 Room Ambient 22 C Relative Humidity 48% Equipment ID#: MO-04, PS-11, RS-10, RS-11, TC TCS(019, 027, 033, 015, 020, 009, 008, 007, 001, 002, 003, 016) TEMPERATURE RISE (Current Carrying Capacity, CCC): 1. Thermocouples shall be calibrated in accordance with Samtec documents; TLWI 0003, Thermocouple Welding Procedure and TLWI 0005, Thermocouple Calibration 2. The thermocouples shall be placed at a location to sense the maximum temperature generated during testing. 3. Temperature stability shall be defined as the temperature at which three successive readings, 5 minutes apart, differ not more than 1 C (computer controlled data acquisition). This is the Temperature Rise that the Current Carrying Capacity and De-rating curves are based on. 4. The following loading configurations shall be tested (double for two row systems): a) One contact energized only b) Two contacts energized adjacent to each other c) Three contacts energized adjacent to each other d) Four contacts energized adjacent to each other e) All contacts energized 5. The following loading configurations shall be tested for Temperature Rise/Current Carrying Capacity testing of two row connector systems: a) Two by One contact energized b) Two by Two contacts energized adjacent to each other c) Two by Three contacts energized adjacent to each other d) Two by Four contacts energized adjacent to each other e) All contacts energized 6. Three samples shall be tested for each of the above configurations for a total of eighteen assemblies. 7. Temperature Rise measurements shall be made at 5 different current levels yielding temperature rises in the 10 to 70 C range. 8. The base curve for the Current Rating chart will be derived from the average (maximum) value of three test specimens in accordance with IEC 512-3, Test 5b. _Power_Test_Report_Rev_3 5 of 24 5/29/2013
6 Part No. MMSD L D-K-LUS Mating Part No. IPL L-D-K Sample Size 8 Technician Tony Wagoner Start Date 6/15/2012 Complete Date 7/6/2012 Room Ambient 22 C Relative Humidity 48% Equipment ID#: MO-10,PS-05, TC TCS(-003,-004,005,-006,-002,-020), THL-10; RS-03 CURRENT CYCLING 1. Samples shall be prepared and tested as above (paragraph 14.5). 2. Current Cycling shall be performed in accordance with EIA , Test Condition 3. Testing shall be as follows: 3.1. Test Current: TEST CURRENT(125% of 30 C Rating) 3.2. ON Time: 45 Minutes 3.3. OFF Time: 15 Minutes 3.4. Number of Cycles: Measurements: 40 minutes into ON cycle Temperature Voltage Drop/Contact Resistance 4. Temperature vs. Number of Cycles and Voltage Drop vs. Number of Cycles shall be measured and recorded. _Power_Test_Report_Rev_3 6 of 24 5/29/2013
7 TEST RESULTS CURRENT CARRYING CAPACITY (CCC) RESULTS There was no evidence of physical damage to the test samples as tested. The following is a summary of the observed data: Temperature Rise, CCC at a 20% de-rating CCC for a 30 C Temperature Rise A per contact with 2 contacts (2 x 1) powered CCC for a 30 C Temperature Rise A per contact with 4 contacts (2 x 2) powered CCC for a 30 C Temperature Rise A per contact with 6 contacts (2 x 3) powered CCC for a 30 C Temperature Rise A per contact with 8 contacts (2 x 4) powered CCC for a 30 C Temperature Rise A per contact with 50 contacts (2 x 25) powered CURRENT CYCLING RESULTS Test Condition: 500 Cycles, 45 minutes ON and 15 minutes OFF Test Current Amps Contact Resistances, Measured 40 minutes into the FIRST and LAST ON cycle o Initial Min mohms Max mohms o Final Min mohms Max mohms Temperature Change, Measured 40 minutes into the FIRST and LAST ON cycle o Initial Temperature Change C o Final Temperature Change C _Power_Test_Report_Rev_3 7 of 24 5/29/2013
8 Resistance (mohms) POWER INTEGRITY TEST TEST DATA CONTACT RATED CURRENT - DC Resistance (DCR) The following data represents the Voltage drop and Contact Resistance at Rated Current for the 100% energized samples: Contact Rated Current (milli-ohms) Max Current (Amps) CONTACT RESISTANCE DATA ALL CONTACTS ENERGIZED (m ) TEST CURRENT AMPS Min Max Avg TEST DATA _Power_Test_Report_Rev_3 8 of 24 5/29/2013
9 Voltage Drop (milli-volts) POWER INTEGRITY TEST VOLTAGE RATED CURRENT The following data represents the Voltage drop at Rated Current for the 100% energized samples: Voltage Rated Current (milli-volts) Current (Amps) Max VOLTAGE DROP DATA ALL CONTACTS ENERGIZED (mv) TEST CURRENT AMPS Min Max Avg _Power_Test_Report_Rev_3 9 of 24 5/29/2013
10 Maximum Current, Amp per Contact POWER INTEGRITY TEST CURRENT CARRYING CAPACITY DATA Room Temp= 22.3 C (Crimp) 2 (2x1) Contacts in Series Part Numbers: MMSD L D-K-LUS / IPL L-D-K Current Rating per Contact (30 Deg. Rise, 20% Derated) = 3.9 Amps Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C Room Temp C Limit Useful Range Ambient Temperature, C _Power_Test_Report_Rev_3 10 of 24 5/29/2013
11 TEMPERATURE RISE DATA TWO CONTACTS ENERGIZED (Degrees Celsius above ambient) TEST CURRENT AMPS Sample Sample Sample Min Max Avg Indicates energized contacts Double Row Configuration Indicates thermocouple monitored, energized contacts _Power_Test_Report_Rev_3 11 of 24 5/29/2013
12 Maximum Current, Amp per Contact POWER INTEGRITY TEST Room Temp= 21.6 C (Crimp) 4 (2x2) Contacts in Series Part Numbers: MMSD L D-K-LUS / IPL L-D-K Current Rating per Contact (30 Deg. Rise, 20% Derated) = 3.2 Amps C Limit Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C Room Temp Useful Range Ambient Temperature, C _Power_Test_Report_Rev_3 12 of 24 5/29/2013
13 TEMPERATURE RISE DATA FOUR CONTACTS ENERGIZED (Degrees Celsius above ambient) TEST CURRENT AMPS Sample Sample Sample Min Max Avg Indicates energized contacts Indicates thermocouple monitored, energized contacts _Power_Test_Report_Rev_3 13 of 24 5/29/2013
14 Maximum Current, Amp per Contact POWER INTEGRITY TEST 7.0 Room Temp= 22.5 C (Crimp) 6 (2x3) Contacts in Series Part Numbers: MMSD L D-K-LUS / IPL L-D-K Current Rating per Contact (30 Deg. Rise, 20% Derated) = 2.8 Amps Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C C Limit Room Temp Useful Range Ambient Temperature, C _Power_Test_Report_Rev_3 14 of 24 5/29/2013
15 TEMPERATURE RISE DATA SIX CONTACTS ENERGIZED (Degrees Celsius above ambient) TEST CURRENT AMPS Sample Sample Sample Min Max Avg Indicates energized contacts Indicates thermocouple monitored, energized contacts _Power_Test_Report_Rev_3 15 of 24 5/29/2013
16 Maximum Current, Amp per Contact POWER INTEGRITY TEST Room Temp= 22.5 C (Crimp) 8 (2x4) Contacts in Series Part Numbers: MMSD L D-K-LUS / IPL L-D-K Current Rating per Contact (30 Deg. Rise, 20% Derated) = 2.6 Amps C Limit Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C Room Temp Useful Range Ambient Temperature, C _Power_Test_Report_Rev_3 16 of 24 5/29/2013
17 TEMPERATURE RISE DATA EIGHT CONTACTS ENERGIZED (Degrees Celsius above ambient) TEST CURRENT AMPS Sample Sample Sample Min Max Avg Indicates energized contacts Indicates thermocouple monitored, energized contacts _Power_Test_Report_Rev_3 17 of 24 5/29/2013
18 Maximum Current, Amp per Contact POWER INTEGRITY TEST Room Temp= 22.0 C (Crimp) 50 (All Power) Contacts in Series Part Numbers: MMSD L D-K-LUS / IPL L-D-K Current Rating per Contact (30 Deg. Rise, 20% Derated) = 1.8 Amps 105 C Limit Base Curve Derated 20 % RT Peak Amp RT Derated Amp Measured Current 65 C 65 C Peak Amp 65 C Derated Amp 75 C 75 C Peak Amp 75 C Derated Amp Limit 95 C Peak Amp 95 C Derated Amp 95 C Room Temp Useful Range Ambient Temperature, C _Power_Test_Report_Rev_3 18 of 24 5/29/2013
19 TEMPERATURE RISE DATA ALL CONTACTS ENERGIZED (Degrees Celsius above ambient) TEST CURRENT AMPS Sample Sample Sample Min Max Avg Indicates energized contacts Indicates thermocouple monitored, energized contacts _Power_Test_Report_Rev_3 19 of 24 5/29/2013
20 TEMPERATURE RISE (Degrees C above Ambient) POWER INTEGRITY TEST CURRENT CYCLING VS. TEMPERATURE RISE Max Rise NUMBER OF CURRENT CYCLES TEMPERATURE RISE DATA ALL CONTACTS ENERGIZED (Degrees Celsius above ambient) INITIAL 50 CYCLES 100 CYCLES 200 CYCLES 500 CYCLES Min Max Avg _Power_Test_Report_Rev_3 20 of 24 5/29/2013
21 CONTACT RATED CURRENT (milli-ohms) POWER INTEGRITY TEST CURRENT CYCLING VS. CONTACT RESISTANCE Max Res NUMBER OF CURRENT CYCLES CONTACT RESISTANCE DATA ALL CONTACTS ENERGIZED (m ) INITIAL 50 CYCLES 100 CYCLES 200 CYCLES 500 CYCLES Min Max Avg _Power_Test_Report_Rev_3 21 of 24 5/29/2013
22 VOLTAGE RATED CURRENT (milli-volts) POWER INTEGRITY TEST CURRENT CYCLING VS. VOLTAGE DROP Max Volt NUMBER OF CURRENT CYCLES VOLTAGE DROP DATA ALL CONTACTS ENERGIZED (MV) INITIAL 50 CYCLES 100 CYCLES 200 CYCLES 500 CYCLES Min Max Avg _Power_Test_Report_Rev_3 22 of 24 5/29/2013
23 EQUIPMENT AND CALIBRATION SCHEDULES Equipment #: MO-04 Description: Model 2700 Multimeter/Data Acquisition System (Integra Series) Manufacturer: Keithley Model: 2700 Serial #: Accuracy: See Manual Last Cal: 3/27/2012, Next Cal: 3/27/2013 Equipment #: MO-10 Description: Model 2750 Multimeter/Switch System (Integra Series) Manufacturer: Keithley Model: 2750 Serial #: Accuracy: See Manual Last Cal: 10/18/2011, Next Cal: 10/18/2012 Equipment #: PS-04 Description: 60V, 50A DC Power Supply-AutoRanging SO Manufacturer: Hewlett Packard/ Agilent Model: AT-6032A Serial #: MY Accuracy: See Manual Equipment #: PS-11 Description: 100V, 7.5A, 750W System DC Power Supply Manufacturer: Agilent Technologies Model: N57491 Serial #: US11M7700J Accuracy: See Manual Equipment #: RS-03 Description: Shunt Manufacturer: EMPRO Model: HA5050 Serial #: HA5050 Accuracy: ± 0.25% RDG Last Cal: 5/30/2012, Next Cal: 5/30/2013 Equipment #: RS-11 Description: Shunt Manufacturer: Vishay Model: VCS202 Serial #: VCS202 Accuracy: ± 1% RDG Last Cal: 5/30/2012, Next Cal: 5/30/2013 _Power_Test_Report_Rev_3 23 of 24 5/29/2013
24 Equipment #: RS-10 Description: Shunt Manufacturer: EMPRO Model: HA10050 Serial #: HA10050 Accuracy: ± 0.25% RDG Last Cal: 5/30/2012, Next Cal: 5/30/2013 Equipment #: TC TCS( ) Description: Calibrated Thermocouples Manufacturer: Samtec, Inc. Model: Serial #: Accuracy: Last Cal: 5/16/2012, Next Cal: 5/16/2013 _Power_Test_Report_Rev_3 24 of 24 5/29/2013
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