Longhorn (S9S08DZ60_AUTO) TEST ELIMINATION REPORT
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1 Longhorn (S9S08DZ60_AUTO) TEST ELIMINATION REPORT 1. Objective This report describes the Longhorn (S9S08DZ60_AUTO) Room Final Test elimination plan and results. Current Final Test Flow: Room Temp Testing Cold Temp Testing Hot Temp Testing In line Quality Assurance (QA) Gate Proposed Final Test Flow: Cold Temp Testing Hot Temp Testing In Line Quality Assurance (QA) Gate 2. General Information Product Family: Longhorn (S9S08DZ60_AUTO) Mask set: M05C & M74K Package(s): LQFN64, LQFP48, LQFP32 Test Site: TJN-FM TJN China Test Platform: Teradyne J Qualification Plan The requirements and acceptance criteria were based on Freescale specification 12MWS10108G. Achieve zero test insert failures from at least 200,000 units tested to the standard production Final Test flow. Units must be sourced from at minimum of 12 wafer lots from the same fab, mask set, and processed over a minimum period of 9 weeks. 4. Correlation/Qualification Results: Page 1 of 6
2 4.1. Lots and Data Summary: The Test Elimination evaluation of 243,669 units resulted in 0 room rejects requiring test enhancement or guard band adjustments. Final Test: Identify any initial rejects and containment actions Failing Test # of units Containment 1 None 0 None required Lot summary. M74K No Device Lot Test Lot Lot Quantity 1 S9S08DV32F1MLH T1DD TJMEA0PK9H S9S08DV32F1MLH T1DD TJMEA0PQ S9S08DZ60F1MLH T1DD TJMEA0PUP S9S08DV32F1MLH T1DD TJMEA0PQSM S9S08DV32F1MLH T1DD TJMEA0PK0Y S9S08DV32F1MLH T1DD TJMEA0PQSV S9S08DV32F1MLH T1DD TJMEA0PQSW S9S08DV32F1MLH T1DD TJMEA0PNB S9S08DZ60F1MLH T1DD TJMEA0PJRV S9S08DV32F1MLH T1DD TJMEA0PNB S9S08DV32F1MLH T1DD TJMEA0PQSR S9S08DZ60F1MLH T1DD TJMEA0PJRQ S9S08DV32F1MLH T1DD TJMEA0P8XU Page 2 of 6
3 14 S9S08DZ60F1MLH T1DD TJMEA0PU8D S9S08DZ60F1MLH T1DD TJMEA0PUPD S9S08DZ32F1MLH T1DD TJMEA0Q3L S9S08DV32F1MLH T1DD TJMEA0PK9E S9S08DZ60F1MLH T1DD TJMEA0PUPA S9S08DV32F1MLH T1DD TJMEA0PNB S9S08DV32F1MLH T1DD TJMEA0Q5MH S9S08DZ32F1MLH T1DD TJMEA0Q80A S9S08DZ60F1VLH T1DD TJMEA0NPWU S9S08DV32F1MLH T1DD TJMEA0PNB S9S08DZ60F1MLH T1DD TJMEA0PUPB S9S08DV32F1MLH T1DD TJMEA0PQ S9S08DV32F1MLH T1DD TJMEA0PQSU S9S08DZ16F1MLF T1DD TJMEA0PRHE S9S08DN60F2VLF T1DD TJMEA0QM S9S08DN60F2VLF T1DD TJMEA0PALA S9S08DN60F2VLF T1DD TJMEA0PWW S9S08DZ60F1MLC T1DD TJMEA0Q5NH S9S08DN32F1CLC T1DD TJMEA0NSPD S9S08DN32F1VLC T1DD TJMEA0L S9S08DN32F1VLC T1DD TJMEA0PJ6G S9S08DZ60F1MLC T1DD TJMEA0Q5NJ Summary 135,683 M05C No Device Lot Assy Lot Room In 36 SC530301DZ60CLH T1DD TJMEA0PMJV SC530301DZ60CLH T1DD TJMEA0PHNM SC530301DZ60CLH T1DD TJMEA0NQWU SC530301DZ60CLH T1DD TJMEA0PMJX SC530301DZ60CLH T1DD TJMEA0PR4X SC530301DZ60CLH T1DD TJMEA0PMJV SC530301DN32VLF T1DD TJMEA0M8ZX Page 3 of 6
4 43 SC530301DN32CLC T1DD TJMEA0PNP SC530301DN32CLC T1DD TJMEA0PNPA SC530301DZ60CLC T1DD TJMEA0PNYJ SC530301DN32CLC T1DD TJMEA0PNPG SC530301DZ60CLC T1DD TJMEA0PSUV SC530301DN32CLC T1DD TJMEA0PNPD SC530301DZ60CLC T1DD TJMEA0PNYH SC530301DZ60CLC T1DD TJMEA0PQ9Y SC530301DZ60CLC T1DD TJMEA0PPU SC530301DZ60CLC T1DD TJMEA0PSUX SC530301DZ32CLC T1DD TJMEA0Q5NP SC530301DZ32CLC T1DD TJMEA0Q7PQ SC530301DZ60CLC T1DD TJMEA0PPU SC530301DZ60MLC T1DD TJMEA0PS SC530301DZ60VLC T1DD TJMEA0Q5NR SC530301DN32CLC T1DD TJMEA0QDBU SC530301DZ60CLC T1DD TJMEA0QEKD SC530301DZ60CLC T1DD TJMEA0PPJ SC530301DZ60CLC T1DD TJMEA0PPJ SC530301DZ60CLC T1DD TJMEA0PPJ SC530301DZ60CLC T1DD TJMEA0PNYG Summary 107,986 Test coverage, Statistical Bin Limits and PAT are not impacted by the room temperature elimination. Page 4 of 6
5 CURRENT FLOW with Room Test FLOW without Room Test Fab Fab Processing 100% Production Processing 100% Production Final Test Final Test Probe Process Probe Process Probe +25 C (Flash) DRB Probe +25 C (Logic & Flash) Mapping 100% ROOM C 100% COLD C 100% HOT Test C part@+85 deg C V part@+105 deg C M part@+125 deg C Probe +25 C (Flash) DRB Probe +25 C (Logic & Flash) Mapping 100% COLD -40 C 100% HOT Test C part@+85 deg C V part@+105 deg C M part@+125 deg C QA/Gate Assembly Assembly QA/Gate Dry Bake Dry Bake Pack & Ship Pack & Ship Page 5 of 6
6 5. Product Quality Customer Return Assessment It has been verified that all available customer returns (CQI) can be detected by the remaining test insertions. 6. Data Analysis and Verification Summary From the above data, it was verified that the the requirements and acceptance criteria based on Freescale specification 12MWS10108G was achieved. For the Final test flow, Room can be eliminated for Longhorn (S9S08DZ60_AUTO) parts. 7. Document History: Rev Date Originator O 26-Apr- Guo Donna 10 Page 6 of 6
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