Fab site: FSL-OHT-FAB (Power Die) : FSL-CHD-FAB (Control Die) Assembly site: FSL-TJN-FM Final Test site: FSL-TJN-FM. Qualification Results: attached

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1 TM Updated March, 2013 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy Efficient Solutions logo, mobilegt, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners Freescale Semiconductor, Inc.

2 Qualification Vehicles: MC10XS3535JHFK (SPP1035 _PQFN) BOM 260 by combination of qualification with Mold Compound G700FG-L and Design Leadframe LF0 qualification with Mold Compound G700FG-L and Design Leadframe LF1 Freescale is pleased to announce the qualification of Mold Compound G700FG-L, Design Leadframe 1 and Control Die Design fix pass 2p5. All future deliveries will be with this configuration. Fab site: FSL-OHT-FAB (Power Die) : FSL-CHD-FAB (Control Die) Assembly site: FSL-TJN-FM Final Test site: FSL-TJN-FM Qualification Results: attached Electrical distribution: MC10XS3535JHFK (SPP1035 ) TM 2 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, the Energy Efficient Solutions logo, mobilegt, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners Freescale Semiconductor, Inc.

3 Devices: Qual family Replacement Device Device SPP1035 MC10XS3535JHFK MC10XS3535HFK SPP1035 MC10XS3535JHFKR2 MC10XS3535HFKR2 SPP1035 MC10XS3535JHFK MC10XS3535DHFK SPP1035 MC10XS3535JHFKR2 MC10XS3535DHFKR2 TM 3 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, the Energy Efficient Solutions logo, mobilegt, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners Freescale Semiconductor, Inc.

4 TM

5 Objective: Freescale PN: MC10XS3535JHFK/R2 Customer Name(s): various Plan or Results: rev 1 PN(s): Revision # & Date: 30 Jan 2013 Part Name: SPP1035 Technology: SMOS8MV/ HD5 Design Engr: various Package: 24PQFN 12X12mm Phone #: various QUARTZ Tracking #: Fab / Assembly / FSL-CHD-FAB (SM8MV) FSL-OHT-FAB (HD5) / FSL-TJN-FM / FSL- Final Test Sites: TJN-FM Product Engr: Wu Shawn-R60117 Phone #: PPE Approval (for Maskset#: Prod. Package Engr: Hosoda Daisuke-NPM173 Hosoda Daisuke-NPM173 M02Y Control Die,N20C Power Die DIM/BOM results) Rev#: Phone #: Jan 2013 Signature & Date: Die Size (in µm) Control Die : (3454x1701) W x L Power Die : (7390x3790) NPI PRQE: Rafael Moreno Phone #: NPI PRQE Approval Rafael MORENO Signature & Date: 30 Jan 2013 Part Operating CAB Approval Grade 1-40 C to +125 C Trace/DateCode: LOT A LOT B LOT C Temp. Grade: Signature & Date: Target Dates Customer Approval Test Start: Test Program Name: Test Program Revision: Signature & Date: Test Finish: SPP1035 New BOM clarification : - Mold Compound G700FG-L - Leadframe LF0 : original down bond + original tie bar + reverse elephant lead. - Mold Compound G700FG-L - Leadframe LF1 : New down bond + original tie bar + reverse elephant lead. This testing is performed by Freescale Reliability Lab unless otherwise noted in the Comments. GROUP A - ACCELERATED ENVIRONMENTAL STRESS TESTS Minimum Stress Test Reference Test Conditions Sample Size # of Lots PC HAST AC TC AEC-Q100G Qualification Plan SPP1035 Mold Compound G700FG-L /Leadframe LF1 and Control Die Metal Fix Change Pass 2p5 Qual Plan JESD22- A113 J-STD-020 JESD22- A110 JESD22- A102 A118 JESD22- A104 AEC Q100- Appendix 3 Preconditioning (PC) : MSL 260 C SAM(11 units/lot) before and after for TC Highly Accelerated Stress Test (HAST): HAST = 130 C/85%RH for 96 hrs. Bias = refer to hast schematics Autoclave (AC): AC = 121oC/15psig for 96 hrs Temperature Cycle (TC): TC = -50 C to +150 C for 1000 cycles WBP after TC on 5 devices from each lot; 2 bonds per corner and one mid-bond per side on each device. Record which pins were used. End Point Requirements RH Total Units including spares Results Lot ID-(#Rej/SS) NA=Not Applicable RH PASS R H WBP =/> 3 grams All surface mount devices prior to HAST, AC,, TC, PC+PTC and as required per test conditions PASS PASS Comments Generic Data 3 lots Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/231 Generic Data 3 lots Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/231 Generic Data 3 lots Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/231 PC + PTC PTC HTSL JESD22- A105 JESD22- A105 JESD22- A103 Preconditioning plus Power Temperature Cycle (PC+PTC): PTC =Ta of -40 C to C for 1000 cycles; Bias = see schematic attached. Power Temperature Cycle (PTC): PTC =Ta of -40 C to C for 1000 cycles; Bias = see schematic attached. High Temperature Storage Life (HTSL): 150 C for 1000 hrs Stress Test Reference Test Conditions HTOL JESD22- A108 High Temperature Operating Life (HTOL): Ta = 150 C for 408 hours Bias = See HTOL drawing RH PASS RH PASS RH PASS TEST GROUP B - ACCELERATED LIFETIME SIMULATION TESTS Minimum Sample Size (Note 1) # of Lots Total Units including spares End Point Requirements RHC Results Lot ID-(#Rej/SS) NA=Not Applicable PASS Generic Data 3 lots Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/24 Generic data 1 lot Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/24 Generic data 1 lot Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/45 Comments Generic data 1 lot Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2: 0/77 ELFR AEC Q Early Life Failure Rate (ELFR): Ta = 150 C for 24 hrs Bias = See HTOL drawing RH PASS Generic Data SPP1035 Generic data from OHT Transfer qualification. Pass : 0/800 AMPDPPAP , Sep /2

6 Stress Test Reference Test Conditions WBS AEC Q Wire Bond shear TEST GROUP C - PACKAGE ASSEMBLY INTEGRITY TESTS Minimum Total Units Results End Point Comments Sample Size # of Lots including Lot ID-(#Rej/SS) Requirements (Note 1) spares NA=Not Applicable Cpk = or > bonds from 5 units 1 5 PASS Performed by Assembly Site during qual lots build CZ WBP SD PD MilStd JESD22- B102 JESD22- B100 Wire Bond Pull (WBP): Cond. C or D Stress Test Reference Test Conditions TEST HBM Freescale 48A AEC-Q Cpk = or > bonds from minimum 5 units 1 5 PASS Performed by Assembly Site during qual lots build CZ Solderability (SD): >95% lead coverage 8hr.(1 hr. for Au-plated leads) Steam age prior to of critical areas test PASS Performed by Assembly Site during qual lots build CZ Physical Dimensions(PD): PD per FSL 98A drawing Cpk = or > PASS Performed by Assembly Site during qual lots build CZ TEST GROUP E - ELECTRICAL VERIFICATION TESTS Minimum Total Units Results End Point Comments Sample Size # of Lots including Lot ID-(#Rej/SS) Requirements (Note 1) spares NA=Not Applicable Pre- and Post Functional / Parametrics (TEST): Test software shall meet requirements of AEC- Q Fails All All All Testing performed to the limits of device specification in temperature and limit value. ElectroStatic Discharge/ Human Body Model Classification (HBM): 500/1000/1500/2000 Volts and 8000 for outx and Vpower See AEC-Q for classification levels. RH 2KV min. 8kV for outx and Vpwr 3 units per Voltage level 1 15 PASS Generic data SPP1035 data from OHT Control die Metal Fix change Pass 2p5 qualification : AMPDPPAP , January 16,2013 CDM AEC-Q ElectroStatic Discharge/ Charged Device Model Classification (CDM): 250/500/750/ Volts See AEC-Q for classification levels. RH All pins =/> 500V Corner pin 750V 3 units per Voltage level 1 18 PASS Generic data SPP1035 data from OHT Control die Metal Fix change Pass 2p5 qualification : AMPDPPAP , January 16,2013 LU AEC-Q Latch-up (LU): Test per JEDEC JESD78 with the AEC-Q requirements. Ta= Maximum operating temperature Vsupply = Maximum operating voltage ED AEC-Q Electrical Distribution (ED) SC Continental requirements HTRB JESD22 A-108 HTGB JESD22 A-108 Short Circuit Characterization (SC) SPP1035: 10mohm : 70 C, IOCH1, 100mohm, TEMIC SC100 High Temperature Reverse Bias Tj = 150 C for 1000 hours Bias = 35 volts ( device reverse biased to 80% of maximum breakdown voltage specification voltage rating indicated in the detail pecification with device biased OFF) High Temperature Gate Bias Tj = 150 C for 1000 hours Vgate bias = 15 volts (max rating for e-switch devices) RH PASS RHC Cpk = or > See Justifications AECQ : SHORT CIRCUIT RELIABILITY PASS POWER DIE ONLY RH PASS Generic data SPP1035 data from OHT Control die Metal Fix change Pass 2p5 qualification : AMPDPPAP , January 16, lot Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p5 1 lot SPP1035 data Mold Compound G700FG-L and Leadframe LF1 + Control Die Pass 2p2 1 lot SPP1035 data from OHT Control die Metal Fix change Pass 2p5 qualification : AMPDPPAP , January 16,2013 Generic data 1 lot Mold Compound G700FG-L and Leadframe LF0. Generic data from HD5 Technology certification vehicle. Pass: 0/77 RH PASS Generic data from HD5 Technology certification vehicle. Pass: 0/231 2/2

7 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT na >10 >10 RT na >10 > Icc3V_Bat12V_Sleep CT na >10 >10 HT na >10 >10 RT na >10 > Icc5p5V_Bat12V_Sleep CT na >10 >10 HT na RT na IBat12V_Sleep_Open CT na HT na RT na IBat12V_Sleep_Short CT na HT ma RT ma >10 > Icc5V_Bat12V_StdBy CT ma >10 >10 HT 0 20 ma >10 >10 RT 0 20 ma >10 > IBat12V_StdBy_OFF CT 0 20 ma >10 >10 HT 0 20 ma >10 >10 RT 0 20 ma >10 > IBat12V_StdBy_ON CT 0 20 ma >10 >10 HT 0 5 ma >10 >10 RT 0 5 ma >10 > Icc5V_Bat12V_SPI CT 0 5 ma >10 >10 HT 5 6 V RT 5 6 V VBat_UV_6to5V CT 5 6 V HT 5 6 V RT 5 6 V VBat_UV_5to6V CT 5 6 V HT 2 3 V RT 2 3 V VCC_UV_7V CT 2 3 V HT 2 3 V /43

8 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT 2 3 V VCC_UV_20V CT 2 3 V HT -2 2 ua >10 >10 RT -2 2 ua >10 > Out1_Leakage_Sleep CT -2 2 ua >10 >10 HT 0 25 ua > RT 0 25 ua > Out1_Leakage_Standby CT 0 25 ua > HT -2 2 ua RT -2 2 ua Out2_Leakage_Sleep CT -2 2 ua HT 0 25 ua > RT 0 25 ua > Out2_Leakage_Standby CT 0 25 ua > HT -2 2 ua RT -2 2 ua Out3_Leakage_Sleep CT -2 2 ua HT 0 25 ua > RT 0 25 ua > Out3_Leakage_Standby CT 0 25 ua > HT -2 2 ua >10 >10 RT -2 2 ua Out4_Leakage_Sleep CT -2 2 ua HT 0 25 ua > RT 0 25 ua > Out4_Leakage_Standby CT 0 25 ua > HT -2 2 ua >10 >10 RT -2 2 ua >10 > Out5_Leakage_Sleep CT -2 2 ua >10 >10 HT 0 25 ua > RT 0 25 ua > Out5_Leakage_Standby CT 0 25 ua > HT 2 3 V RT 2 3 V /43

9 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS 8880 VPWR_PORN_D CT 2 3 V HT 2 3 V RT 2 3 V VCC_PORN_D CT 2 3 V HT 2 3 V RT 2 3 V VCC_PORN_P CT 2 3 V HT 2 4 V RT 2 4 V > VPWR_POR2 CT 2 4 V HT V RT V VBat_OverVoltage_th CT V HT KOhm >10 >10 RT KOhm > R_PullUp_Vcc_5V CT KOhm HT KOhm >10 >10 RT KOhm >10 > R_PullDown_0p2Vcc_5V CT KOhm >10 >10 HT KOhm >10 >10 RT KOhm >10 > R_PullDown_0p2Vcc_5V CT KOhm >10 >10 HT KOhm >10 >10 RT KOhm >10 > R_PullDown_0p2Vcc_5V CT KOhm >10 >10 HT KOhm >10 >10 RT KOhm >10 > R_PullDown_Vcc_5V CT KOhm HT KOhm >10 >10 RT KOhm >10 > R_PullDown_Vcc_5V CT KOhm HT KOhm RT KOhm R_PullDown_Vcc_5V CT KOhm /43

10 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT KOhm >10 >10 RT KOhm >10 > R_PullDown_Vcc_5V CT KOhm > HT KOhm > RT KOhm R_PullDown_Vcc_5V CT KOhm HT V >10 >10 RT V >10 > IGN_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > IGN_Forward_V CT mv >10 >10 HT V >10 >10 RT V >10 > FLASHER_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > FLASHER_Forward_V CT mv >10 >10 HT V > RT V >10 > STOP_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > STOP_Forward_V CT mv >10 >10 HT V >10 >10 RT V >10 > LIMP_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > LIMP_Forward_V CT mv >10 >10 HT V >10 >10 RT V >10 > CS_Clamp_V CT V >10 >10 HT mv >10 >10 4/43

11 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT mv >10 > CS_Forward_V CT mv >10 >10 HT V >10 >10 RT V >10 > RST_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > RST_Forward_V CT mv >10 >10 HT V >10 >10 RT V >10 > SCLK_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > SCLK_Forward_V CT mv >10 >10 HT V >10 >10 RT V >10 > SI_Clamp_V CT V >10 >10 HT mv >10 >10 RT mv >10 > SI_Forward_V CT mv >10 >10 HT mv > RT mv > Vil_3V CT mv > HT mv > RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT mv >10 >10 RT mv > /43

12 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS 1406 Vil_3V CT mv > HT mv > RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT mv > RT mv > Vil_3V CT mv > HT mv > RT mv > Vil_5p5V CT mv > HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT mv > RT mv > Vil_3V CT mv > HT mv >10 >10 RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 6/43

13 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT mv > RT mv > Vil_3V CT mv > HT mv >10 >10 RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT mv >10 >10 RT mv > Vil_3V CT mv > HT mv >10 >10 RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT mv >10 >10 RT mv > Vil_3V CT mv > HT mv > RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT mv >10 >10 7/43

14 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT mv > Vil_3V CT mv > HT mv > RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT mv >10 >10 RT mv > Vil_3V CT mv > HT mv > RT mv >10 > Vil_5p5V CT mv >10 >10 HT V >10 >10 RT V >10 > Vih_3V CT V >10 >10 HT V >10 >10 RT V >10 > Vih_5p5V CT V >10 >10 HT V >10 >10 RT V >10 > VOUT6_ON_Vcc_3V CT V >10 >10 HT V >10 >10 RT V >10 > VOUT6_ON_Vcc_5p5V CT V >10 >10 HT mv >10 >10 RT mv >10 > VOUT6_OFF_Vcc_3V CT mv >10 >10 HT mv >10 >10 RT mv >10 >10 8/43

15 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS 1523 VOUT6_OFF_Vcc_5p5V CT mv >10 >10 HT -1 1 ua >10 >10 RT -1 1 ua >10 > I_leak_SO_0V_Vcc_3V CT -1 1 ua >10 >10 HT -1 1 ua >10 >10 RT -1 1 ua >10 > I_leak_SO_3V_Vcc_3V CT -1 1 ua >10 >10 HT V >10 >10 RT V >10 > V_SO_H_Vcc_3V CT V HT mv >10 >10 RT mv >10 > V_SO_L_Vcc_3V CT mv >10 >10 HT -1 1 ua >10 >10 RT -1 1 ua >10 > I_leak_SO_0V_Vcc_5p5V CT -1 1 ua >10 >10 HT -1 1 ua >10 >10 RT -1 1 ua >10 > I_leak_SO_5p5V_Vcc_5p5V CT -1 1 ua >10 >10 HT V >10 >10 RT V > V_SO_H_Vcc_5p5V CT V >10 >10 HT mv >10 >10 RT mv >10 > V_SO_L_Vcc_5p5V CT mv >10 >10 HT V > RT V > VCLOCKH_3V CT V > HT V > RT V > VCLOCKH_5p5V CT V > HT V RT V WakeUp_Threshold_3V CT V >10 >10 9/43

16 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT V RT V >10 > WakeUp_Threshold_3V CT V > HT V RT V WakeUp_Threshold_3V CT V >10 >10 HT V > RT V >10 > WakeUp_Threshold_5p5V CT V >10 >10 HT V >10 >10 RT V >10 > WakeUp_Threshold_5p5V CT V >10 >10 HT V > RT V >10 > WakeUp_Threshold_5p5V CT V >10 >10 HT V > RT V > OUTPUT1_VOLTAGE_THR_VBAT7V CT V > HT V > RT V > OUTPUT2_VOLTAGE_THR_VBAT7V CT V > HT V > RT V > OUTPUT3_VOLTAGE_THR_VBAT7V CT V > HT V > RT V > OUTPUT4_VOLTAGE_THR_VBAT7V CT V > HT V >10 >10 RT V >10 > OUTPUT1_VOLTAGE_THR_VBAT20V CT V >10 >10 HT V >10 >10 RT V >10 > OUTPUT2_VOLTAGE_THR_VBAT20V CT V >10 >10 HT V >10 >10 10/43

17 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT V >10 > OUTPUT3_VOLTAGE_THR_VBAT20V CT V >10 >10 HT V >10 >10 RT V >10 > OUTPUT4_VOLTAGE_THR_VBAT20V CT V >10 >10 HT V > RT V > OUTPUT5_VOLTAGE_THR_VBAT7V CT V > HT V >10 >10 RT V >10 > OUTPUT5_VOLTAGE_THR_VBAT20V CT V >10 >10 HT us RT us OUTx_delay_ON_14V_SR1 CT us HT us RT us OUTx_delay_ON_14V_SR1 CT us HT us RT us OUTx_delay_ON_14V_SR1 CT us HT us RT us OUTx_delay_ON_14V_SR1 CT us HT us RT us OUTx_delay_ON_14V_SR1 CT us HT us RT us OUTx_delay_OFF_14V_SR1 CT us HT us RT us OUTx_delay_OFF_14V_SR1 CT us HT us RT us /43

18 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS OUTx_delay_OFF_14V_SR1 CT us HT us RT us OUTx_delay_OFF_14V_SR1 CT us HT us RT us OUTx_delay_OFF_14V_SR1 CT us HT RT us It is a calculation test between TDLYon-TDLY OUTx_Tdly_delta_14V_SR1 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing OUTx_Tdly_delta_14V_SR1 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing OUTx_Tdly_delta_14V_SR1 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing OUTx_Tdly_delta_14V_SR1 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing OUTx_Tdly_delta_14V_SR1 CT HT us RT us /43

19 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS It is a calculation test between TDLYon-TDLY off, no impact in the application, 590 OUTx_delay_ON_14V_SR0 CT us improvement ongoing HT us RT us OUTx_delay_ON_14V_SR0 CT us HT us RT us OUTx_delay_ON_14V_SR0 CT us HT us RT us OUTx_delay_ON_14V_SR0 CT us HT us It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing It is a calculation test between TDLYon-TDLY off, no impact in the application, 598 OUTx_delay_ON_14V_SR0 CT us improvement ongoing HT us RT us OUTx_delay_OFF_14V_SR0 CT us HT us RT us OUTx_delay_OFF_14V_SR0 CT us HT us RT us OUTx_delay_OFF_14V_SR0 CT us HT us RT us OUTx_delay_OFF_14V_SR0 CT us HT us RT us OUTx_delay_OFF_14V_SR0 CT us /43

20 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing 2251 OUTx_Tdly_delta_14V_SR0 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing 2252 OUTx_Tdly_delta_14V_SR0 CT HT It is a calculation test between TDLYon-TDLY off, FAB process improvement plan have been RT us with Conti already 2253 OUTx_Tdly_delta_14V_SR0 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing 2254 OUTx_Tdly_delta_14V_SR0 CT HT It is a calculation test between TDLYon-TDLY off, no impact in the application, RT us improvement ongoing 2255 OUTx_Tdly_delta_14V_SR0 CT HT mv/us RT mv/us OUT1_SR_Up_14V_SR1 CT mv/us HT mv/us > RT mv/us OUT1_SR_Down_14V_SR1 CT mv/us HT mv/us RT mv/us > OUT2_SR_Up_14V_SR1 CT mv/us /43

21 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT mv/us > RT mv/us OUT2_SR_Down_14V_SR1 CT mv/us HT mv/us > RT mv/us > OUT3_SR_Up_14V_SR1 CT mv/us > HT mv/us > RT mv/us > OUT3_SR_Down_14V_SR1 CT mv/us HT mv/us > RT mv/us > OUT4_SR_Up_14V_SR1 CT mv/us > HT mv/us > RT mv/us > OUT4_SR_Down_14V_SR1 CT mv/us HT mv/us RT mv/us OUT5_SR_Up_14V_SR1 CT mv/us HT mv/us RT mv/us OUT5_SR_Down_14V_SR1 CT mv/us HT m > RT m > OUTx_SR_delta_14V_SR1 CT m > HT m > RT m >10 > OUTx_SR_delta_14V_SR1 CT m >10 >10 HT m RT m > OUTx_SR_delta_14V_SR1 CT m > HT m RT m > OUTx_SR_delta_14V_SR1 CT m > HT m > /43

22 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT m > OUTx_SR_delta_14V_SR1 CT m > HT mv/us > RT mv/us > OUTx_SR_Up_14V_SR0 CT mv/us > HT mv/us > RT mv/us > OUTx_SR_Down_14V_SR0 CT mv/us > HT mv/us > RT mv/us OUTx_SR_Up_14V_SR0 CT mv/us HT mv/us RT mv/us OUTx_SR_Down_14V_SR0 CT mv/us HT mv/us RT mv/us > OUTx_SR_Up_14V_SR0 CT mv/us HT mv/us RT mv/us OUTx_SR_Down_14V_SR0 CT mv/us HT mv/us RT mv/us > OUTx_SR_Up_14V_SR0 CT mv/us HT mv/us > RT mv/us OUTx_SR_Down_14V_SR0 CT mv/us HT mv/us > RT mv/us > OUTx_SR_Up_14V_SR0 CT mv/us > HT mv/us > RT mv/us > OUTx_SR_Down_14V_SR0 CT mv/us > HT m > RT m > /43

23 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS 2200 OUTx_SR_delta_14V_SR0 CT m HT m >10 >10 RT m >10 > OUTx_SR_delta_14V_SR0 CT m >10 >10 HT m >10 >10 RT m > OUTx_SR_delta_14V_SR0 CT m > HT m >10 >10 RT m > OUTx_SR_delta_14V_SR0 CT m > HT m > RT m OUTx_SR_delta_14V_SR0 CT m #REF! 4011 #REF! 4012 #REF! 4013 #REF! 4014 #REF! 4020 #REF! 4021 #REF! RT C RT C RT C RT C RT C RT C RT C /43

24 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS 4022 #REF! 4023 #REF! 4024 #REF! 4030 TSD_7V 4031 TSD_7V 4032 TSD_7V 4033 TSD_7V 4034 TSD_7V 4040 TSD_28V 4041 TSD_28V 4042 TSD_28V RT C RT C RT C HT C RT C HT C RT C HT C RT C HT C RT C HT C RT C HT C RT C HT C RT C HT C RT C HT C /43

25 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT C TSD_28V HT C RT C TSD_28V HT 3 30 us > RT 3 30 us > OUTx_OTS_delay_7V HT 3 30 us > RT 3 30 us >10 > OUTx_OTS_delay_7V HT 3 30 us >10 >10 RT 3 30 us > OUTx_OTS_delay_7V HT 3 30 us > RT 3 30 us > OUTx_OTS_delay_7V HT 3 30 us > RT 3 30 us > OUTx_OTS_delay_7V HT 3 30 us > RT 3 30 us > OUTx_OTS_delay_20V HT 3 30 us >10 >10 RT 3 30 us >10 > OUTx_OTS_delay_20V HT 3 30 us >10 >10 RT 3 30 us >10 > OUTx_OTS_delay_20V HT 3 30 us >10 >10 RT 3 30 us >10 > OUTx_OTS_delay_20V HT 3 30 us > RT 3 30 us > /43

26 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS OUTx_OTS_delay_20V HT A RT A OCHI1_7V CT A HT A RT A OCHI1_7V CT A HT A RT A OCHI1_7V CT A HT A RT A OCHI1_7V CT A HT A RT A OCHI1_7V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI2_7V CT A /43

27 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT A RT A OCHI2_7V CT A HT A RT A OCHI2_7V CT A HT A RT A OCHI2_7V CT A HT A RT A OCHI2_7V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCHI1_20V CT A HT A RT A OCLO_7V CT A HT A RT A OCLO_7V CT A HT A /43

28 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT A OCLO_7V CT A HT A RT A OCLO_7V CT A HT A RT A OCLO_7V CT A HT A RT A OCLO_20V CT A HT A RT A OCLO_20V CT A HT A RT A OCLO_20V CT A HT A RT A OCLO_20V CT A HT A RT A OCLO_18V CT A HT % RT % OUTx_ERROR_0p75FSR CT % HT % RT % OUTx_ERROR_0p50FSR CT % HT % RT % OUTx_ERROR_0p25FSR CT % HT % RT % /43

29 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % CLED_OUTx_ERROR_0p75FSR CT % HT % RT % CLED_OUTx_ERROR_0p50FSR CT % HT % RT % CLED_OUTx_ERROR_0p25FSR CT % HT % RT % CLED_OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > CLED_OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % OUTx_ERROR_0p75FSR CT % HT % RT % OUTx_ERROR_0p50FSR CT % HT % RT % OUTx_ERROR_0p25FSR CT % HT % RT % OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > OUTx_ERROR_50mAFSR CT >10 >10 23/43

30 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS HT % RT % CLED_OUTx_ERROR_0p75FSR CT % HT % RT % CLED_OUTx_ERROR_0p50FSR CT % HT % RT % CLED_OUTx_ERROR_0p25FSR CT % HT % RT % CLED_OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > CLED_OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % OUTx_ERROR_0p75FSR CT % HT % RT % OUTx_ERROR_0p50FSR CT % HT % RT % OUTx_ERROR_0p25FSR CT % HT % RT % OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % CLED_OUTx_ERROR_0p75FSR CT % HT % /43

31 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS RT % CLED_OUTx_ERROR_0p50FSR CT % HT % RT % CLED_OUTx_ERROR_0p25FSR CT % HT % RT % CLED_OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > CLED_OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % OUTx_ERROR_0p75FSR CT % HT % RT % OUTx_ERROR_0p50FSR CT % HT % RT % OUTx_ERROR_0p25FSR CT % HT % RT % OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % CLED_OUTx_ERROR_0p75FSR CT % HT % RT % CLED_OUTx_ERROR_0p50FSR CT % HT % RT % /43

32 OHT - SPP1035 pass 2p5 Electrical +125 C/+25 C/-40 C Cp/Cpk Study Lot 1 : M02Y(Pass2P5):TH276042/N20C:ER Test# Test Name Insertion low Hi units Mean Stdev CP CPK COMMENTS / EXPLANATIONS CLED_OUTx_ERROR_0p25FSR CT % HT % RT % CLED_OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > CLED_OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % OUTx_ERROR_0p75FSR CT % HT % RT % OUTx_ERROR_0p50FSR CT % HT % RT % OUTx_ERROR_0p25FSR CT % HT % RT % OUTx_ERROR_0p10FSR CT % HT >10 >10 RT >10 > OUTx_ERROR_50mAFSR CT >10 >10 HT % RT % CLED_OUTx_ERROR_0p75FSR CT % HT % RT % CLED_OUTx_ERROR_0p50FSR CT % HT % RT % CLED_OUTx_ERROR_0p25FSR CT % HT % RT % CLED_OUTx_ERROR_0p10FSR CT % /43