IESNA LM MEASURING LUMEN MAINTENANCE OF LED LIGHT SOURCES MEASUREMENT AND TEST REPORT. For

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1 IESNA LM MEASURING LUMEN MAINTENANCE OF LED LIGHT SOURCES MEASUREMENT AND TEST REPORT For Room 316, Building 2, No.1, Xianke Yi Road, Huadong Town, Huadu District, Guangzhou, China Model:100B10C10(Ra2) Report Type: 7000 Hours Test Report Product Type: LED Array Test Engineer: Daniel Duan Report Number: RSZ M3 Test Date: to Report Date: Revised Note: Reviewed By: Prepared By: The previous report RSZ M2 is replaced by this report on Jeanne Han /Safety Manager Bay Area Compliance Laboratories Corp. (Dongguan). No.69, Pulongcun, Puxinhu Industry Area, Tangxia, Dongguan, Guangdong, China Tel: Fax: Note: The test data was only valid for the test sample(s). This test report is prepared for the customer shown above and for the device described herein. It may not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Dongguan). This report is valid only with a valid digital signature. The digital signature may be available only under the Adobe software above version 7.0.

2 TABLE OF CONTENTS 1 - GENERAL INFORMATION DESCRIPTION OF LED LIGHT SOURCES STANDARDS USED: TEST FACILITY DESCRIPTION OF AUXILIARY EQUIPMENT OPERATING CYCLE AMBIENT CONDITIONS PHOTOMETRY MEASUREMENT UNCERTAINTY SAMPLE SET SUMMARY OF TEST RESULT TEST DATA DATA SET 1, 85 C, 3500MA (LUMEN MAINTENANCE) DATA SET 1, 85 C, 3500MA (CHROMATICITY SHIFT) DATA SET 2, 100 C, 3500MA (LUMEN MAINTENANCE) DATA SET 2, 100 C, 3500MA (CHROMATICITY SHIFT) APPENDIX A EUT PHOTO A.1 MECHANICAL DIMENSIONS (TA = 25 C) A.2 EUT PHOTO APPENDIX B REVISION HISTORY Report No. RSZ M3 Page 2 of 18 IESNA LM Test Report

3 1 - GENERAL INFORMATION 1.1 Description of LED Light Sources Devices tested Part Number: 100B10C10(Ra2) Part Type: LED Array Nominal CCT: 3000K Power: W Average Current Density per LED die: mA/mm 2 Average Power Density per LED die: W/mm 2 CRI: 80 Die Spacing: 0.88mm Family products covered by this report: According to ENERGY STAR Requirements for the Use of LM-80 Data, the following products can be covered by this report base on the information and declaration provided by manufacturer. The information of these models shows that the covered products meet all section 4 requirements of ENERGY STAR Requirements for the Use of LM-80 Data (September 28, 2017) This report covers the following models: Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 100B10C10(Ra2) 100B10C10(Ra1) HL-LT005F22W- 100B10C10(Ra1) HL-LT005F22W Report No. RSZ M3 Page 3 of 18 IESNA LM Test Report

4 Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 100B10C10(Ra2) 100B10C10(Ra1) 100B10C10(Ra2) 100B10C10(Ra1) 100B10C10(Ra2) 70B7C10(Ra1) 70B7C10(Ra2) HL-LT005F22W- 70B7C10(Ra1) HL-LT005F22W Report No. RSZ M3 Page 4 of 18 IESNA LM Test Report

5 Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 70B7C10(Ra2) 70B7C10(Ra1) 70B7C10(Ra2) 70B7C10(Ra1) 70B7C10(Ra2) 50B5C10(Ra1) 50B5C10(Ra2) HL-LT005F22W- 50B5C10(Ra1) HL-LT005F22W Report No. RSZ M3 Page 5 of 18 IESNA LM Test Report

6 Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 50B5C10(Ra2) 50B5C10(Ra1) 50B5C10(Ra2) 50B5C10(Ra1) 50B5C10(Ra2) 40B4C10(Ra1) 40B4C10(Ra2) HL-LT005F22W- 40B4C10(Ra1) HL-LT005F22W Report No. RSZ M3 Page 6 of 18 IESNA LM Test Report

7 Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 40B4C10(Ra2) 40B4C10(Ra1) 40B4C10(Ra2) 40B4C10(Ra1) 40B4C10(Ra2) 30B3C10(Ra1) 30B3C10(Ra2) HL-LT005F22W- 30B3C10(Ra1) HL-LT005F22W Report No. RSZ M3 Page 7 of 18 IESNA LM Test Report

8 Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 30B3C10(Ra2) 30B3C10(Ra1) 30B3C10(Ra2) 30B3C10(Ra1) 30B3C10(Ra2) 20B2C10(Ra1) 20B2C10(Ra2) HL-LT005F22W- 20B2C10(Ra1) HL-LT005F22W Report No. RSZ M3 Page 8 of 18 IESNA LM Test Report

9 Model name CCT(typ.) CRI (typ.) Series Parallel Power intensity(w/mm 2 ) Dies Spacing (mm) Current(A) 20B2C10(Ra2) 20B2C10(Ra1) 20B2C10(Ra2) 20B2C10(Ra1) 20B2C10(Ra2) The family models HL-LT005FXXW-XBXCX(RaX)and tested model 100B10C10(Ra2) could meet all the requirements listed as below: a. the tested model has been conducted on the largest LED array and have the largest per chip current; b. the family models have the equal or fewer LED dies than the tested model; c. die spacing greater than or equal to the tested model; d. power density (i.e. W/mm 2 of PCB or substrate total area, or equivalent calculation) less than or equal to the tested model; e. identical materials used (note: this does not constrain quantity and/or dimensional adjustments); f. identical construction processes used; 1.2 Standards Used: IESNA LM-80-08: IES Approved Method for Measuring Lumen Maintenance of LED Light Sources. ENERGY STAR Requirements for the Use of LM-80 Data (This standard was not accredited by IAS) Report No. RSZ M3 Page 9 of 18 IESNA LM Test Report

10 1.3 Test Facility The testing facility used by Bay Area Compliance Laboratories Corp. (Dongguan). is located at No.69, Pulongcun, Puxinhu Industry Area, Tangxia, Dongguan, Guangdong, China. 1.4 Description of Auxiliary Equipment Device Manufacture Model No Serial No Test Range Calibration date Calibration due date 2.0m integrating sphere EVERFINE R N/A Standard Light Source EVERFINE D N/A Precision digital stabilized DC power supply High accuracy array spectroradiometer LM-80 High power full-automatic aging equipment Digital CC&CV DC Power Supply Digital CC&CV DC Power Supply Digital CC&CV DC Power Supply Digital CC&CV DC Power Supply Digital CC&CV DC Power Supply Digital CC&CV DC Power Supply EVERFINE WY605 G115987C J VA EVERFINE HAAS T nm BACL B ~ EVERFINE WY (50/15A) EVERFINE WY (50/15A) EVERFINE WY (50/15A) EVERFINE WY (50/15A) EVERFINE WY (50/15A) EVERFINE WY (50/15A) Operating Cycle Samples are driven with a constant direct current (DC) 1.6 Ambient Conditions For lumen maintenance test, samples were operated in thermal chambers with minimal ambient airflow. For long term reliability test, the case temperature was controlled by mounting several thermocouples on a sample reliability stress board at the designated thermal measurement point, as shown in APPENDIX. The ambient temperature T A was measured by several thermocouples at a distance of 5 mm above the reliability test board. The relative humidity within chamber was less than 65%. For photometry measurement, temperature was set to 25 C ± 2 C, RH <65%. Report No. RSZ M3 Page 10 of 18 IESNA LM Test Report

11 1.7 Photometry Measurement Uncertainty The uncertainty of the light output measurements is U=1.59% (K=2), at the 95% confidence level. The uncertainty of the correlated color temperature measurements is U=21K (K=2), at the 95% confidence level. This calibration results traceable to the NATIONAL INSTITUTE OF METROLOGY (NIM). 1.8 Sample Set Sampling Method: LED samples for IESNA LM-80 testing consist of units built from a minimum of three manufacturing lots with each manufacturing lot built from different wafer lots built on non-consecutive days. These manufacturing lots are picked to represent a wide parametric distribution. Each Sample is soldered to all of the reliability stress boards for a given set of IESNA LM-80 tests. Sample Size: Total 30Pcs; Each Ts test condition 15Pcs The samples tested at TS 85 C and TS 100 C were received at and tested during to The samples were numbered from 1to 15 and 16 to 30. Data Set 1: 85 C,3500mA Part Number: Number of Units: 15 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: Data Set 2: 100 C, 3500mA Part Number: Number of Units: 15 Actual Case Temperature(T S ): Actual Ambient Temperature(T A ): Life Test Drive Current: Measurement Current: 100B10C10(Ra2) T S =84.0 C T A =82.6 C I F =3500mA I F = 3500mA 100B10C10(Ra2) T S =99.2 C T A =98.1 C I F = 3500mA I F = 3500mA Report No. RSZ M3 Page 11 of 18 IESNA LM Test Report

12 2 - SUMMARY OF TEST RESULT Data Set: Data Set 1, 85 C, 3500mA Number of Units: 15 Failures Observed: 0 Test Interval and Test Duration: 0h,1000h,2000h,3000h,4000h,5000h,6000h,7000h Average. Lumen Maintenance at7000 hours: 96.63% Average Chromaticity Shift at 7000 hours( u v ): Reported TM-21 L 70 Lifetime: >39,000 hours Data Set: Data Set 2, 100 C, 3500mA Number of Units: 15 Failures Observed: 0 Test Interval and Test Duration: 0h,1000h,2000h,3000h,4000h,5000h,6000h,7000h Average. Lumen Maintenance at 7000 hours: 95.76% Average Chromaticity Shift at 7000 hours( u v ): Reported TM-21 L 70 Lifetime: >39,000 hours Report No. RSZ M3 Page 12 of 18 IESNA LM Test Report

13 3 - Test Data 3.1 Data Set 1, 85 C, 3500mA (Lumen Maintenance) V F(V) Φ(lm) Lumen Maintenance (%) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: 7000 hours Failures Observed: 0 α: 6.277E-06 β: Calculated L 70 : 58,000hours Reported L 70 : >39,000hours Report No. RSZ M3 Page 13 of 18 IESNA LM Test Report

14 % Luminous Flux 3.2 Data Set 1, 85 C, 3500mA (Chromaticity Shift) u v CCT(K) Chromaticity Shift ( u v ) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ M3 Page 14 of 18 IESNA LM Test Report

15 3.3 Data Set 2, 100 C, 3500mA (Lumen Maintenance) V F(V) Φ(lm) Lumen Maintenance (%) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs Ave Med st dev Min Max TM-21 Projection: Test Duration: 7000 hours Failures Observed: 0 α: 7.768E-06 β: Calculated L 70 : 47,000hours Reported L 70 : >39,000hours Report No. RSZ M3 Page 15 of 18 IESNA LM Test Report

16 % Luminous Flux 3.4 Data Set 2, 100 C, 3500mA (Chromaticity Shift) u v CCT(K) Chromaticity Shift ( u v ) No. 0hr(Initial) 1000hrs 2000hrs 3000hrs 4000hrs 5000hrs 6000hrs 7000hrs Ave Med st dev Min Max % 105% 100% 95% 90% 85% 80% 75% 70% Flux u'v' Time (hours) Chromaticity Shift (Du'v') Report No. RSZ M3 Page 16 of 18 IESNA LM Test Report

17 Appendix A EUT PHOTO A.1 Mechanical Dimensions (Ta = 25 C) All dimensions are in millimeter A.2 EUT Photo 100B10C10(Ra2) TMP LED Report No. RSZ M3 Page 17 of 18 IESNA LM Test Report

18 Appendix B REVISION HISTORY Report Number Report Date Contents RSZ /09/28 Original report. RSZ M1 2015/03/02 Correct the typos of some titles. RSZ M2 2015/06/09 Correct the typos of models. RSZ M3 2019/01/12 Update the Logo and address of lab on the Page1&10 Update Company name and address on page 1. Add DUT Characteristics on page 3 according to ENERGY STAR requirements ***********END OF REPORT*********** Report No. RSZ M3 Page 18 of 18 IESNA LM Test Report