Technical Documents for. Qualification of 1550nm DFB Laser Diode Module for WDM

Transcription

1 Technical Documents for Qualification of 1550nm DFB Laser Diode Module for WDM Lightwave Technologies Dept. Photonic Products Division

2 1. General This report describes reliability of 1.5µm DFB laser diode modules for WDM which are manufactured by 2. Part numbers This document covers the modules of following products; SLT5411-xA, SLT5411-xB SLT5412-xA, SLT5412-xB, SLT5412-xP SLT5413-xA, SLT5413-xB SLT5414-xA, SLT5414-xB, SLT5414-xP 3. Aging test results of laser chips 3-1. Aging test conditions Table 1 shows test conditions. Nine aging tests were proceeded in different conditions and different wafers. Figure 3 and figure 4 shows the aging test results of each test Criteria of failure 20% increase of operation current from initial value Distributions of lifetime Log-Normal distributions of each test are shown in Figure 1-a and Figure 1-b. Standard deviations of the distribution are 0.34 to 0.89 (average:4). Figure 2 shows the arrhenius plot of all test results Failure rate calculation Activation energy of 0.4eV is assumed for converting lifetime at normal operating conditions(rated power;31 C). The calculated median life time and failure rate after 15 years and 20 years are shown below. Rated Power Median Life Failure rate (15 years) Failure rate (20 years) [mw] [Hour] [FIT] [FIT] Median life of peak wavelength drift Peak wavelength shifts to longer wavelength during the APC operation mainly caused by increment of operation current. In case initial operation current is large, which corresponds to high rated power specification, the end of life(eol) which is determined by maximum wavelength shift will be shorter than the EOL which is determined by operation current increase of 20%. Under the assumption that the EOL is wavelength shift of 0.1nm or 0.2nm, the median life and failure rate are calculated using the aging test results used in Section /11 -

3 Rated Power Wavelength shift Median Life Failure rate (15 years) Failure rate (20 years) [mw] [nm] [Hour] [FIT] [FIT] 0.2 (> ) (<2.6) (<14) 1 and (> ) (<2.6) (<14) (> ) (<9.7) (<43) LD will reach the operation current increase of 20% before wavelength shifts to defined value. 5. Reliability test results of laser modules Reliability test results of the laser modules are summarized in Table 2. Actual data are shown in p.7 through p Track record of 1550nm DFB laser diode modules in the field Customer Number of shipped devices (from May 1997 to Sept. 1998) Total device hours (as of May 2000) Number of failed devices : A Japanese equipment manufacturer : 2657pcs : hours : 0pcs Total operating time (as of May 2000) : hours (*) Estimated failure rate : 23 FIT(C.L.60%) : 58 FIT(C.L.90%) (*)Estimated operating time (Presupposition for the estimation) Installation lead time : 2 months Number of devices installed /Number of devices shipped : 80% Operating hours : 24 hours / day Revision Record Document No. Date Description Incorporated by Checked by Approved by HUX A Sept. 18, 1998 Issue N. Kushida A.Miki T. Fujitani HUX B Dec. 28, 1998 LD module results are added A. Miki N. Kushida T. Fujitani HUX C May 24, 2000 Latest aging test results are T.Nakabayashi N.Kushida T.Fujitani added HUX D Feb 23, 2001 SLT5414 series are added T.Kounosu N.Kushida K.Tanida - 2/11 -

4 Distribution [*sigma] #4 #3 #2 #1 # E+04 1.E+05 1.E+06 1.E+07 Life Time [Hour] Figure 1-a Distribution of life time (test 1~5) 3 2 #9 #6 Distribution [*sigma] #7 #8 test # -3 1.E+04 1.E+05 1.E+06 1.E+07 Power Case Temp. Wafer lot Life Time [Hour] Figure 1-b Distribution of life time (test 6~9) Table 1. Test conditions and evaluated median life Sample size Median Life Sigma Aging Hour [mw] [deg.c] [Hour] [Hour] # E # E # E # E # E # E # E # E # E Distribution Figure 1-a Figure 1-b - 3/11 -

5 1.E+07 Median Life [Hour] 1.E+06 1.E+05 Criteria : Iop=20% #1 #3 #2 Ea=0.4eV is assumed. 1.E /Tj [1/K] Figure 2. Arrhenius Plot of Median Life The sample size of each point show in Fig.2. #1~#3 shows the Tj of operating conditions. #1,#2 and #3 corresponds to Pf=20mW, 10mW, 5mW, respectively. - 4/11 -

6 Test 1-a 50deg.C 5mW APC n=15 Test 1-b 50deg.C 5mW APC n= Test 2-a 85deg.C 5mW APC n=8 Test 2-b 85deg.C 5mW APC n= Test 3 85deg.C 10mW APC n=11 Test 4 85deg.C 10mW APC n= Figure 3. Aging test results (Test 1~Test4) - 5/11 -

7 Test 5 70deg.C 15mW APC n=13 Test 6 50deg.C 20mW APC n= Test 7 50deg.C 20mW APC n=13 Test 8 50deg.C 20mW APC n= Test 9 50deg.C 20mW APC n= Figure 4. Aging test results (Test 5~Test9) - 6/11 -

8 Table 2. Reliability Test Results of 1550nm DFB LD Modules Heading Mechanical Integrity Endurance Special Tests ref. : GR-468-CORE Item Test Conditions Sampling Failure Limits Mechanical Shock 1500G,ms 3axis, 5times/axis 11 0 Vibration 20G, 20~2000Hz 4min/cycle, 4cycles/axis 11 0 Thermal Shock T=100 C, 15cycles 11 0 Pf<±dB Solderability 350 C, 3sec Im<±10% Fiber Pull 1kg, 10sec., 3times 11 0 at Iop=const. -40 C to +70 C Tld=25±1 C Temperature Cycling 100times pass/fail times for info. High Temp. Storage +85 C, 2000hours 11 0 Low Temp. Storage -40 C, 2000hours 11 0 Damp Heat 85 C/85%, 2000Hours 11 0 Tc=70 C, Tld=25 C P f =20mW (at beginning) hours Accelerated Aging Tc=70 C, Tld=25 C P f =11mW (at beginning) 5000hours 9 0 Internal Moisture 11 0 ESD Threshold 100pF, 1.5kΩ, ±500V, 5times/each polarity 6 0 Iop<±20% at Im=const. Tld=25±1 C water vapor 5000ppm Pf<±dB Im<±10% R therm <±10% R Peltier <±10% at Iop=const. Tld=25±1 C - 7/11 -

9 Mechanical shock Criteria : Pf<±dB, Im<±10% sample size : n= Im [%] After -1 After Vibration Criteria : Pf<±dB, Im<±10% sample size : n= Im [%] After -1 After Thermal Shock Solderability Criteria : Pf<±dB sample size : n=11 Criteria : Pf<±dB sample size : n= After -1.5 After Dip - 8/11 -

10 Fiber Pull Criteria : Pf<±dB sample size : n= After Pull Temperature Cycling Criteria : Pf<±dB, Im<±10% sample size : n= Im [%] Cycles Cycles High Temperature Storage Low Temperature Storage Criteria : Pf<±dB sample size : n=11 Criteria : Pf<±dB sample size : n= Time [Hours] Time [Hours] - 9/11 -

11 Damp Heat Criteria : Pf<±dB sample size : n= Time [Hours] Accelerated Aging Criteria : Iop<±20% sample size : n= n= n=5 Iop/Iop Iop/Iop Accelerated Aging Criteria : Iop<±20% sample size : n=9-10/11 -

12 Internal Moisture Criteria : water vapor<5000ppm sample size : n=11 Sample No. A-1 A-2 A-3 A-4 A-5 A-6 A-7 A-8 A-9 A-10 A-11 H2O(vapor) [ppm] H2 [%] N2 [%] O2 [%] <1 1 <1 1 1 N.D. 1 <1 N.D. 2 1 ESD Threshold Criteria : Pf<±dB, Im<±10%, R therm <±10%, R Peltier <±10% sample size : n=6 Cumulative Failure ESD Voltage Sample LD PD Peltier Cooler Thermistor [V] Pin No.12 & 13 Pin No.4 & 5 Pin No.6 & 7 Pin No.1 & /11 -