Metrology and Calibration of Mechatronic Systems. Metrology and Calibration of Mechatronic Systems overview (v2.1) Adrian M.

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1 Metrology and Calibration of Mechatronic Systems

2 Mechatronics Training Curriculum Premium Workshop Mechatronics System Design Advanced Advanced Motion Control (5 days) Advanced Feedforward Control Design Principles Masterclass (8 sessions) Advanced Mechatronic System Design (6 days) Standard Motion Control Tuning (6 days) Design Principles Basics (5 days) Design for Additive Manufacturing Design for Ultra Clean Vacuum (4 days) Dynamics and Modelling Experimental Techniques in Mechatronics Metrology & Calibration of Mechatronic Systems Actuation and Power Electronics Machine Vision in Mechatronic Systems (2 days) Thermal Effects in Mechatronic Systems Basic Mechatronics System Design part 2 (5 days) Mechatronics System Design part 1 (5 days) Summer School Opto Mechatronics (5 days) Start * Relevant partner trainings: Applied Optics, Electronics for nonelectrical engineers, System Architecture, Soft skills for technology professionals,

3 Mechatronics Training December 31, 2009 Philips decided to stop all its training activities, which were carried out by the Philips Centre for Technical Training (CTT), and all training programs were transferred to external parties. Currently, all former Philips trainings (and more) are offered to the market under the umbrella of The High Tech Institute ( Content partner for all Mechatronics courses is Mechatronics Academy B.V. ( which is set-up and supervised by : Professor Dr.ir. Jan van Eijk Professor Dr.ir. Maarten Steinbuch Dr.ir. Adrian Rankers

4 Metrology and Calibration of Mechatronic Systems Trainers Dr.ir. Rens Henselmans (NTS-Group) Dr.ir. Stefan Bäumer (TNO) Dr.ir. René Klaver (Heidenhain) Ir. Jef Horijon (Assembleon) Dr.ir. Adrian Rankers (Mechatronics Academy) Course Director(s) Dr.ir. Rens Henselmans (NTS-Group) Dr.ir. Adrian Rankers (Mechatronics Academy)

5 Global Program Day Topic Presenter 1 Introduction / Definitions Short Range Sensors Interferometry Systems Encoder Systems 2 Case Introduction Mechatronic Context Metrology on System Level Rens Henselmans Rens Henselmans Stefan Bäumer René Klaver Rens Henselmans Adrian Rankers Rens Henselmans 3 System Calibration Rens Henselmans SMD component mounter case Wrap-Up & Closure Jef Horijon Adrian Rankers

6 Day 1 (morning) Introduction & Metrology definitions Short Range Sensors Sensor terminology (range, resolution, sensitivity etc.) Sensor types (capacitive, inductive, optical etc.)

7 Day 1 (afternoon) Displacement interferometry (principle, components, error sources etc.) Encoders (theory, various types)

8 Day 2 (morning) Case introduction Measurement machine for freeform optics Analysis of existing solutions Performance estimation Mechatronic context Control theory summary Influence of sensor properties / placement

9 Day 2 (afternoon) Metrology on System Level Design for low uncertainty Error types Rules of Abbe and Bryan System loops Quantity of concern Error budgeting basics

10 Day 3 (morning) System Calibration Basics Calibration instruments & artefacts Self-calibration Calibration application examples Use of calibration data

11 Day 3 (afternoon) SMD Component Mounter Case Vision Metrology Calibration of Series Products

12 Sign-up for this training Via the website of our partner The High Tech Institute