CALIBRATION SYSTEM CERTIFICATE
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1 CALIBRATION SYSTEM CERTIFICATE With respect to products (measuring instruments and testing instruments), we hereby certify that we have established our calibration system traceable to the national (international) standards, as shown below. Mitutoyo Corporation qualifies for the registered business operator *1 of the Japan Calibration Service System (JCSS * ) and use standards that are traceable to the national standard owned by the National Metrology Institute of Japan / National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) for calibration service. Being endorsed by the above facts, the calibration results stated in the Mitutoyo-issued calibration certificate stamped with a JCSS mark shall be deemed to be traceable to the national standard. The Production, Inspection and Calibration Service Departments of Mitutoyo Corporation also use standards which are traceable to the standard calibrated in advance by one of the registered operators of JCSS to perform inspection and calibration services for products (measuring equipment) so that calibration results are traceable to the national standard. Since the International Accreditation Japan / National Institute of Technology and Evaluation (IAJapan/NITE), which is the accredited organization of JCSS, has signed in the International Laboratory Accreditation Cooperation (ILAC) and the Asia Pacific Laboratory Accreditation Cooperation (APLAC), the calibration certificate issued by Mitutoyo Corporation and stamped with a JCSS mark shall be valid in the countries and commercial areas which also have signed in ILAC and APLAC. *1) In Mitutoyo Corporation, we have 6 JCSS registered operations as follows: Metrological Standards Calibration Section Miyazaki Plant Utsunomiya Calibration Center Kawasaki Calibration Center Hiroshima Calibration Center Techno Services Business Division *) The JCSS registered operator conforms to the requirement of ISO/IEC Mitutoyo Corporation Quality Assurance Department As of Yasuhiro Takahashi, Department Manager QA-I00008 Rev /6
2 Traceability of Mitutoyo Standard National Metrology Institute of Japan / National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) The atomic clock synchronized to UTC <National (Primary) Standard> Traceability of length field National Metrology Institute of Japan / National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) The atomic clock synchronized to UTC and the optical frequency comb <National (Primary) Standard> Traceability of Temperature NMIJ/AIST Temperature fixed points <National (Primary) Standard> Frequency Standard Oscillator <Secondary Standard> (As a standard of optical frequency comb) NMIJ/AIST Reference flat JEMIC Temperature fixed point <National (Sub-Primary) Standard> (JCSS Accredited Cal.Lab. No.0030) JCSS Accredited Cal.Lab. Temperature fixed point/ Platinum resistance thermometer <Secondary Standard> (JCSS Accredited Cal.Lab. No.0030) Standard Gauge Block Standard Gauge Block Mitutoyo Metrological Standards Calibration Section Temperature fixed point (Triple point of water) / Platinum resistance thermometer Mitutoyo Techno Services Business Division (JCSS Accredited Cal.Lab. No.0186) Standard Gauge Block / Step Gage / Standard Scale /633 nm Stabilized He-Ne Laser Standard Gauge Block / Micrometer Standard / Step Gage Mitutoyo Hiroshima Calibration Center (JCSS Accredited Cal.Lab. No.0109) Standard Gauge Block / Micrometer Standard / Step Gage Working Standard Step Gage Gauge Block Ring Gage Dial Indicator Tester Standard Scale Laser Length Measuring Machine Optical Flat / Optical Parallel Measuring Instrument Coordinate Measuring Machines Vision Measuring Systems Precision Sensors Small Tool Instruments Form Measurement Scale Units Optical Measuring Thermometer This chart shows a simplified traceability system of a part of Mitutoyo products. Detailed traceability charts are published for each product. QA-I00008 Rev.34.0 /6
3 Traceability of Test Equipment National Metrology Institute of Japan / National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) National Institute of Information and Communications Technology Mitutoyo Hiroshima Calibration Center (JCSS Accredited Cal.Lab.No.0109) Rockwell Hardness Reference Blocks <Secondary Standard> Mitutoyo Kawasaki Calibration Center (JCSS Accredited Cal.Lab.No.0086) Force-proving Instruments <Secondary Standard> Frequency Standard Oscillator <Secondary Standard> (As a standard of optical frequency comb) Japan Quality Assurance Organization Japan Electric Meters Inspection Corporation Japan Bearing Inspection Institute (JCSS Accredited Cal.Lab. No.0030) JCSS Accredited Cal.Lab. JCSS Accredited Cal. Lab. Balance Piezoelectric / Servo Acceleration Pickup Electric standards Force Measuring Machine Gauge Block Standard Scale Non-automatic Balance Mitutoyo Hiroshima Calibration Center (JCSS Accredited Cal. Lab. No.0109) Hardness Testing Machines/Hardness Reference Blocks Testing Weights Vibration Testing Machine / Vibrometers TEST Equipment Hardness Testing Machines Balancing Machines Vibration Testing Machines Vibrometers Seismological Instruments This chart shows a simplified traceability system of a part of Mitutoyo products. Detailed traceability charts are published for each product. QA-I00008 Rev /6
4 Certification of Accreditation by JCSS (1) () (3) (1) Metrological Standards Calibration Section () Miyazaki Plant (3) Utsunomiya Calibration Center (4) Kawasaki Calibration Center (5) Hiroshima Calibration Center (6) Techno Services Business Division (4) (5) (6) QA-I00008 Rev /6
5 Scope of Service and Calibration Uncertainty General Field of Calibration:Length Type of Service Item Calibration Scope L is measured length (mm) 1 Laser Wavelength Frequency stabilized laser in the 633 nm / 53 nm region Length Gauge Blocks Gauge Blocks From 0.1 mm up to 100 mm 0.00 μm Measuring (Interferometry More than 100 mm up to 50 mm ( L) µm Instrument method) More than 50 mm up to 1000 mm ( L) µm 3 Gauge Blocks Gauge Blocks From 0.1 mm up to 100 mm 0.06μm (Comparison method) More than 100 mm up to 1000 mm ( L) µm 4 End gages with Check Master Up to 100 mm ( L/1000) µm 5 Flat ends Caliper Checker 6 (Interferometry method) Inside Micro Checker 7 Step Master Up to 1 mm μm 8 End gages with Depth Micro (0.5+L/1000) µm From 0.5 mm up to 300 mm Flat ends Checker 9 (Comparison method) Height Master Up to 1000 mm 10 Cylindrical Gages From 5 mm up to 500 mm 11 Micrometer (0.4+L/1000) µm From 5 mm up to 1000 mm standards 1 Standard Scale Standard scale Up to 350 mm ( L/1000) µm More than 350 mm up to 1000 mm ( L/1000) µm 13 Reference scale Pattern size: From 0. mm up to 4 mm 0.11 µm 14 Calibration chart 15 Ring gages Setting Rings From 6 mm up to 80 mm 0.7 μm More than 80 mm up to 10 mm 0.8 μm 16 Calibration testers Calibration Tester Up to 5 mm 0.10 μm For dial gages More than 5 mm up to 5 mm 0.1 μm More than 5 mm up to 100 mm ( L/1000) µm 17 Micrometers (including Micrometer Heads) Up to 5 mm 0.3 μm More than 5 mm up to 500 mm (1.+L/175) µm 18 Indicating Micrometers Micrometer: Up to 100 mm (0.9+L/50) µm Indicator: ±0.06 mm (0.3+L/15) µm 19 Calipers Up to 600 mm 0.0 mm More than 600 mm up to 1000 mm 0.03 mm 0 Height Gages Up to 600 mm mm More than 600 mm up to 1000 mm 0.00 mm 1 Depth Gages Up to 600 mm 0.0 mm More than 600 mm up to 1000 mm 0.03 mm Dial gages Dial Indicators Up to 5 mm 0.5 μm More than 5 mm up to 50.8 mm 1.1 μm More than 50.8 mm up to 100 mm 1.7 μm 3 Dial Test Indicators Up to 0.6 mm 0.5 μm More than 0.6 mm up to 1.6 mm 1. μm 4 Cylinder gauges Bore Gages From 6 mm up to 400 mm 0.7 μm 5 Electrical Mu-Checker ±5 μm 0.15 μm comparators ±00 μm 0. μm ±000 μm 1.0 μm 6 Dimensional Measuring Instrument Sphere (Average diameter) 7 Coordinate Measuring Machines 8 Surface Texture Master Ball From mm less than 10 mm 0.06 μm From 10mm up to 40 mm ( L/1000) µm Coordinate Measuring Machines, Vision Measuring System Roughness specimen Up to 61 mm ( L/1000) µm Up to 650 mm ( L/1000) µm Up to 1000 mm (0.+0. L/1000) µm Up to mm Note ( L/1000) µm Depth: From 0.3 µm up to 0 µm Arithmetical mean deviation of the roughness profile: From 0.1 µm up to 5 µm Maximum height of the roughness profile From 0.3 µm up to 0 µm d (.74 ) nm d (µm): Depth Ra (.74 ) nm Ra (µm): Arithmetical mean deviation of the roughness profile Rz (.74 ) nm Rz (µm): Maximum height of the roughness profile QA-I00008 Rev /6
6 General Field of Calibration:Temperature 1 Contact type thermometer Type of Service Resistance thermometer (Comparison calibration) Temperature sensors with display unit (Comparison calibration) Calibration Scope 100 Ω From 0 C up to 40 C (Four wires System) From 0 C up to 40 C 6 mk 8 mk General Field of Calibration:Force 1 Force-proving Instruments Type of Service Calibration Scope According to JIS B 778 (ISO 376) Compression From 10 N up to 00 N 0.04 % From 30 N up to kn % General Field of Calibration:Hardness 1 Rockwell hardness testing machines, etc. Vickers hardness testing machines, etc. Type of Service Rockwell Hardness Reference Blocks Rockwell Hardness Testing Machines Vickers Hardness Reference Blocks Calibration Scope From 0 HRC up to 5 HRC 0.43 HRC - More than 5 HRC less than 35 HRC 0.44 HRC - From 35 HRC up to 45 HRC 0.4 HRC - More than 45 HRC less than 55 HRC 0.39 HRC - From 55 HRC up to 65 HRC 0.35 HRC - From 0 HRC up to 5 HRC HRC More than 5 HRC less than 35 HRC HRC From 35 HRC up to 45 HRC HRC More than 45 HRC less than 55 HRC HRC From 55 HRC up to 65 HRC HRC From 85HV up to 1050 HV (Test force from N up to N) d > 193 µm. % d 193 µm (8/d) % Where: d is the length of a diagonal line of the indentation (µm) Note1) Calibration and Measurement Capabilities: These values are the smallest uncertainties. Therefore, they sometimes differ from the uncertainties written in the Calibration Certificates Note) Exclude Vision Measuring System. QA-I00008 Rev /6
Schedule. 300 mm to 600 mm 600 mm to 1000 mm inch to 12 inch
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