S E E HARDNESS ASSURANCE TEST

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2 S E E HARDNESS ASSURANCE TEST Finished Product Information Product MFG MFG Lot Device Package MFG Part # Number Type Type Voltage IR IRUH3301A2AK H Regulator FlatPack Product Description Adj reg configured for a 3.3V output. Nominal input 5.0V Die Information Die MFG MFG Lot Wafer IR MFG Part # Number Number Part # HoneyWell SSEC RIC _001 4 C02R279K- 1 Penn State NA C021520K IMR Number Die Technology SOI CMOS IV Bipolar Planar Bias 1: Bias 1 Conditions: SERIAL NUMBERS TESTED PER BIAS TYPE Serial number 86, 97, 87, 95 Vin =6.8V, Load =1.5A, Board 1. Temperature ~22C and >100C Bias 2: Bias 2 Conditions: Serial number 86, 97, 87, 95 Vin =3.8V, Load =1.5A, Board 1.Temperature ~22C and >100C Bias 3: Bias 3 Conditions: Serial number 43 and 28 Vin =6.8V, Load =2.75A, Serial number 62 and 52 Vin =6.8V, Load =0.06A, Board 2. Temperature ~22C and >100C Bias 4: Bias 4 Conditions: Serial number 43 and 28 Vin =3.8V, Load =2.75A, Serial number 62 and 52 Vin =3.8V, Load =0.06A, Board 2. Temperature ~22C and >100C Page 2 International Rectifier QF414 Hi-Rel Products Associated Procedure: T030062G Rev. A

3 Radiation Lot Assurance Test QF414 Rev. A Test Method Test Specification In-Flux: Non -in-flux: JESD57 T09176G Yes Yes RUN SUMMARY 1 Serial Ion Beam LET Energy Fluence Number Specie Type 86 Au 15A E Au 15A E Au 15A E Au 15A E+06 Flux Range Number of Runs 1.0E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E Kr 15A E Kr 15A E Kr 15A E Kr 15A E E4 to 1.0E5 1.0E4 to 1.0E5 1.0E4 to 1.0E5 1.0E4 to 1.0E Xe 15A E Xe 15A E Xe 15A E Xe 15A E Au 15A E Au 15A E Au 15A E Au 15A E Kr 15A E Kr 15A E Kr 15A E Kr 15A E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E E4 to 1.0E A detailed log of each run is attached to this lot disposition on form QF416. Page 3 International Rectifier QF414 Hi-Rel Products Associated Procedure: T030062G Rev. A

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5 IRUH3301A2AK Single-Event Test Report December 2009 International Rectifier currently does not have a DSCC approved Radiation Hardness Assurance Program for MIL-PRF

6 SEE Test Report IRU3301A2AK December 2009 Table of Contents Introduction. 3 Test Plan. 4 Results. 5 Summary..11 Conclusion.11 Appendix A Transient Waveforms Appendix B Electrical Data Appendix C Test Plan Appendix D Test Procedure Appendix F Log Sheets 205 Crawford St, Leominster, Ma Tel:

7 SEE Test Report IRU3301A2AK December 2009 INTRODUCTION On December 15, International Rectifier Corp. (IR) tested the IRUH3301A2AK for Single Event Effects (SEE) hardness. The irradiation was performed at Texas A&M Cyclotron Test Facility. The SEE testing was conducted to determine the effects of various Ion species Gold (Au), Krypton (Kr) and Xenon (Xe) had on the IRUH3301A2AK Ultra Low Drop Adjustable Positive Linear Regulator. The testing conditions consisted of varying input voltages, resistive loads and temperature of the device in situ. The IRUH3301A2AK parts were soldered in place and had the recommend capacitance and layout conditions specified in the data sheet specification. The devices were exposed to the selected ion beams to characterize single event transients (SET) and determine if there will be any single event latch-ups (SEL) and single event burn out (SEB). The energy levels, Linear Energy Transfer (LET), and the range of penetration for all ion particles chosen are defined in the table shown below. Ion Species Ions Energy Angle ( o Effective LET ) (MeV) (MeV (mg/cm 2 )) Range in Si (μ) 84 Kr Xe Au Crawford St, Leominster, Ma Tel:

8 SEE Test Report IRU3301A2AK December 2009 TEST PLAN The complete Test Plan is located in Appendix B. In summary, the SEE test plan varied the input voltage, load current and temperature of the device (table 1). The adjustable regulator was configured as a 3.3V nominal output. Input Voltage (V) Load Current (A) Device Case Temp ~25C ~25C ~100C ~100C ~25C ~25C ~100C ~100C ~25C ~25C ~100C ~100C Table 1: Test Conditions Single Event Transient data was collected for each run, while the devices were being exposed to gold, krypton and xenon specie. Each device selected was tested at least twice to monitor both positive and negative transients. All transients greater than 50mV were counted and recorded. The 50mV threshold was due to a limitation of the Keithley 776 programmable counter device, but another factor was the noise level of the equipment and the surrounding area, which was between 20mV-30mV. 205 Crawford St, Leominster, Ma Tel:

9 SEE Test Report IRU3301A2AK December 2009 RESULTS All devices were tested to a maximum LET of 85.4 MeV and did not have any occurrence of single event latch-up (SEL) over the entire input voltage, load current and temperature conditions. During all SEE runs, none of the devices under exposure experienced any catastrophic event. Single Event Transient (SET) data shows a relationship between the input voltage and the amplitude of the transient. When the IRUH3301A2AK regulator s input voltage was set to 6.8V, the amplitude of the transients were approximately 150mV. When the input voltage was set to 3.8V the transient s amplitude was approximately 60mV. The figure 1-4 below, show the relationship of input voltage to amplitude of transients. Figure 5, shows a typical negative transient. Figure 6, shows a unique transient only captured once during all the SEE testing and Figure 7, shows a small oscillation transient captured in all different types of test conditions. Figure 1: Run 26, Serial number 95, Vin = 6.8V, Load = 1.5A. 205 Crawford St, Leominster, Ma Tel:

10 SEE Test Report IRU3301A2AK December 2009 The positive transient of figure 1 (serial #95) is approximately 150mV in amplitude, which is the worst transient experienced for a 6.8V input voltage and 1.5A test condition. Figure 2 below, show the same serial number as figure 1(serial #95), but the input voltage changed to 3.8V, all other conditions remained the same. The transient amplitude was lowered to approximately 62mV. Figure 2: Run 34, Serial number 95, Vin = 3.8V, Load = 1.5A 205 Crawford St, Leominster, Ma Tel:

11 SEE Test Report IRU3301A2AK December 2009 Figure 3: Run 53, Serial number 62, Vin = 6.8V, Load = 0.06A Figure 3, shows a transient of approximately of 150mV. The load condition was changed to 60mA and the input voltage was set to 6.8V. In contrast, Figure 4 below, is the same serial number (Serial #62), but the input voltage was changed to 3.8V. The transient shows the amplitude to be approximately 62mV. The result shows a relationship with input voltage and transient amplitudes. 205 Crawford St, Leominster, Ma Tel:

12 SEE Test Report IRU3301A2AK December 2009 Figure 4: Run 63, Serial number 62, Vin = 3.8V, Load = 0.06A. 205 Crawford St, Leominster, Ma Tel:

13 SEE Test Report IRU3301A2AK December 2009 Figure 5: Run 40, Serial number 28, Vin =6.8, load =2.75A. Negative transients occurred during SEE testing and are displayed in Figure 5. The transient amplitude is approximately 42 mv, which is much smaller than the ~150mV for other transients with an input voltage of 6.8V. 205 Crawford St, Leominster, Ma Tel:

14 SEE Test Report IRU3301A2AK December 2009 Figure 6: Run 23, Serial number 87, Vin = 6.8V, Load = 1.5A. The transient shown in figure 6 is the only one with the unique shape in all the SEE testing. The amplitude is again approximately 150mV. 205 Crawford St, Leominster, Ma Tel:

15 SEE Test Report IRU3301A2AK December 2009 Figure 7: Run 1, Serial number 95, Vin = 6.8V, Load = 1.5A. The waveform in figure 7 shows a another type of transient captured during SEE testing with all different types of test conditions. The IRUH3301A2AK was exposed to gold, krypton and xenon. The test results explained above were for gold, but the results for krypton and xenon were similar. During testing we noticed that the oscilloscope and counter detected transients when the shutter of the cyclotron was opened and closed. We proved the above theory in the last 3 runs, where we moved the beam off the IRUH3301A2AK device and then opened and closed the shutter of the cyclotron. We did this test three times and captured a small number of counts on the detector. The next step was running the part with no beam applied and found no counts on the 205 Crawford St, Leominster, Ma Tel:

16 SEE Test Report IRU3301A2AK December 2009 detector. This proves there is some noise or EMI associated with the shutter opening and closing. We believe this noise effected an increase in the number of counts in the test results with larger than thirty counts. Appendix A has a table listing the worst transient counts per run. Following the table is a list of figures showing the transients experienced in that particular run. SUMMARY Eight devices of part number IRUH3301A2AK, a positive adjustable hybrid regulator were evaluated for Single-Event Latch-Up (SEL), Single-Event Burnout (SEB) and Single-Event Transients (SET) with heavy ions. International Rectifier conducted the SEL, SEB and SEL tests on December 15, 2009 at Texas A&M University. Both the input and output of the device under test were monitored for voltage change, current change, and transients. The devices were exposed to gold, krypton and xenon ions in open-air with a heat sink applied to every device under test. The data indicates no Single Event Latchup (SEL) or Single Event Burnout (SEB) up to a LET of 85.4 MeV under three resistive loads of 60mA, 1.5A and 2.75A, two input voltages of 3.8V and 6.8V and two temperatures of 22C and >100C. Transients were captured and recorded at a period of ~30us / frame. Post irradiation tests resulted in all devices passing their specified limits. CONCLUSION Part number IRUH3301A2AK was characterized for SET with a variety of different test conditions and the results conclude the worst transient found was ~150mV (Figure 1). The counting of transient per test condition found there to be no dependence on test condition or specie irradiated. One observation was the transient amplitude dependence on the input voltage applied to the regulator. When the input voltage was set to 6.8V, rather than 3.8V, higher amplitude transient were observed. The IRUH3301A2AK was exposed to gold, krypton and xenon and did not have a Single Event Latch-up or Single Event Burn-Out (SEB) occur. 205 Crawford St, Leominster, Ma Tel:

17 SEE Test Report IRU3301A2AK December 2009 Appendix A Transient Waveforms 205 Crawford St, Leominster, Ma Tel:

18 SEE Test Report IRU3301A2AK December 2009 RUN ION LET # SPECIE MeV.cm 2 /mg TEMP deg C PART # S/N SKT # Load (A) Vin (V) Transient Count + Threshold Transient Count - Threshold 8 Au C IRHU3301A2AK Au C IRHU3301A2AK Au C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Au 85.4 >100C IRHU3301A2AK Kr C IRHU3301A2AK Kr 27.8 >100C IRHU3301A2AK Kr C IRHU3301A2AK Xe 11.7 >100C IRHU3301A2AK Xe 11.7 >100C IRHU3301A2AK Table of runs with transient counts 205 Crawford St, Leominster, Ma Tel:

19 SEE Test Report IRU3301A2AK December 2009 Run 8; is a negative transient response for gold specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied. 205 Crawford St, Leominster, Ma Tel:

20 SEE Test Report IRU3301A2AK December 2009 Run 9; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

21 SEE Test Report IRU3301A2AK December 2009 Run 9; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

22 SEE Test Report IRU3301A2AK December 2009 Run 11 is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

23 SEE Test Report IRU3301A2AK December 2009 Run 17; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied 205 Crawford St, Leominster, Ma Tel:

24 SEE Test Report IRU3301A2AK December 2009 Run 20; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

25 SEE Test Report IRU3301A2AK December 2009 Run 23; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

26 SEE Test Report IRU3301A2AK December 2009 Run 26; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

27 SEE Test Report IRU3301A2AK December 2009 Run 27; is a negative transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

28 SEE Test Report IRU3301A2AK December 2009 Run 40; is a negative transient response for gold specie. Channel 1 is the output voltage with a 2.75A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

29 SEE Test Report IRU3301A2AK December 2009 Run 46; is a positive transient response for gold specie. Channel 1 is the output voltage with a 60mA, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

30 SEE Test Report IRU3301A2AK December 2009 Run 50; is a Negative transient response for gold specie. Channel 1 is the output voltage with a 2.75A, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

31 SEE Test Report IRU3301A2AK December 2009 Run 53; is a transient response for gold specie. Channel 1 is the output voltage with a 60mA load, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

32 SEE Test Report IRU3301A2AK December 2009 Run 53; is a transient response for gold specie. Channel 1 is the output voltage with a 60mA load, Channel 0 is the input voltage with 6.8Vapplied. 205 Crawford St, Leominster, Ma Tel:

33 SEE Test Report IRU3301A2AK December 2009 Run 80; is a positive transient response for krypton specie. Channel 1 is the output voltage with a 60mA load, Channel 0 is the input voltage with 6.8V applied. 205 Crawford St, Leominster, Ma Tel:

34 SEE Test Report IRU3301A2AK December 2009 Run 90; is a negative transient response for krypton specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied. 205 Crawford St, Leominster, Ma Tel:

35 SEE Test Report IRU3301A2AK December 2009 Run 97; is a positive transient response for krypton specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied. 205 Crawford St, Leominster, Ma Tel:

36 SEE Test Report IRU3301A2AK December 2009 Run 101; is a positive transient response for xenon specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied. 205 Crawford St, Leominster, Ma Tel:

37 SEE Test Report IRU3301A2AK December 2009 Run 108; is a positive transient response for xenon specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied. 205 Crawford St, Leominster, Ma Tel:

38 SEE Test Report IRU3301A2AK December 2009 Appendix A Electrical Data 205 Crawford St, Leominster, Ma Tel:

39 SEE Test Report IRU3301A2AK December 2009 Electrical Test Data (Pre and Post SEE) Loop Stability Loop Stability Loop Stability Loop Stability Shutdown Shutdown Threshold Off Shutdown Threshold On Dropout Voltage Timed Latch Off Over Current Latchup Vout (Vin=5.8V,Io=3A) Vout (Vin=5.8V,Io=50mA) Vout (Vin=3.8V,Io=3A) Vout (Vin=3.8V,Io=50mA) Vref (Vin=3.3V,Io=50mA) Socket Continuity Test Name Test Numb er Lower Limit Upper Limit U n i t s ma V V V V V A ms V V V mv mvpp mvpp mvpp mvpp S i t e # Pre SEE Se rial # B i n Post SEE Crawford St, Leominster, Ma Tel:

40 SEE Test Report IRU3301A2AK December 2009 Appendix B Test Plan 205 Crawford St, Leominster, Ma Tel:

41 SEE Test Report IRUH3301A2AK December 2009 Test Plan 1.0 Purpose The purpose of this test is to qualify this product for single event latch-up and single event transients. 2.0 Test Responsibility International Rectifier shall be responsible for conducting the tests, which shall be performed at Texas A&M s Cyclotron facility. International Rectifier shall be responsible for the final Test Report. 3.0 Test Facility 3.1 Accelerator The Texas A&M Cyclotron shall be used to provide the necessary ion species and energy. 3.2 Test Equipment The necessary test equipment including the test interface board, cables, power supplies, etc shall be provided by IR. IR shall provide the equipment needed to handle the individual test devices. 4.0 Test Devices 4.1 The IRHU3301A2AK devices are planned for SEE evaluation and all SEE test specifications should be referred to the T090176G. 4.2 All devices shall be built in their respective packages. Devices shall be properly packed in static-free containers. 4.3 All devices shall be verified for correct electrical performance (baseline) prior to SEE testing. 5.0 Test Method Mil- PRF shall be used to establish procedure for all testing described herein. 6.0 Test Report The Test Report shall include the following information: a. Device type(s), serial numbers, wafer lot identification (per active component) b. Test dates and personnel names c. Facility, source type d. Schematic of test circuit e. Insitu bias conditions f. Comments and observations g. Pre and Post Electrical data h. Summary descriptive including graphs (if applicable) 7.0 Record Keeping All single event exposure information shall be recorded on the data file and used to correlate data from different exposure levels. The TAMU facility shall provide a hardcopy and a softcopy summary of all exposure runs showing key parameters such as; LET and ion specie, flux rate, fluence level, time duration for exposure, and comments regarding the tests including observations or deviations from the plan. 205 Crawford St, Leominster, Ma Tel:

42 SEE Test Report IRUH3301A2AK December 2009 SEE Test Rack 205 Crawford St, Leominster, Ma Tel:

43 SEE Test Report IRUH3301A2AK December 2009 SEE DUT BOARD 205 Crawford St, Leominster, Ma Tel:

44 SEE Test Report IRUH3301A2AK December 2009 Appendix C Test Procedure 205 Crawford St, Leominster, Ma Tel:

45 SEE Test Report IRUH3301A2AK December 2009 Bias Condition Table 4: Single Event Effects Test Requirements 6 Test Information Vin = 3.8V, 6.8V Load = 60mA, 1.5A and 2.75A Program Card Number Board Number Test Program Test Console Chamber Temperature NA TF TS_09026_IRUH3301A2A_REV TC Air TC = 100C +/-3C, DUT clamped to Aluminum Heatsink and Tcase is monitored with a themocouple. 15A MeV Beams Texas A&M only Average Ion Specie LET Energy Range Flux Total Fluence Angle Deg Beam Length Gold Krypton Xenon E E E E E E E mm 1.00E mm 1.00E mm 205 Crawford St, Leominster, Ma Tel:

46 SEE Test Report IRUH3301A2AK December 2009 TEST CIRCUIT 1 J2 SMA Scope probe Ch1 U1 F2_1 1 8 GND_A VIN_B F1_1 2 GND_B VIN_A 7 C1 0.1uF C2 1.0uF C3 100uF C4 100uF 3 4 SHDN Adj VOUT_B VOUT_A J4 SMA Scope probe Ch2 and Counter R C9 C10 0.1uF 1.0uF C11 100uF C12 100uF R3 2.0-RH025-25W R5 0.2 RH025-25W 205 Crawford St, Leominster, Ma Tel:

47 SEE Test Report IRUH3301A2AK December 2009 Appendix D Log Sheets 205 Crawford St, Leominster, Ma Tel:

48 SEE Test Report IRUH3301A2AK December Crawford St, Leominster, Ma Tel:

49 SEE Test Report IRUH3301A2AK December 2009 DATE : 12/15/09 OPERATORS : D. Lisiewicz, J. Brandt, W. Hu FACILITY : TEXAS A&M PAGE 1 OF 5 RUN ION LET ENERGY RANGE AVG FLUX # SPE CIE MeV.c m 2 /mg MeV μm #/ cm 2 /sec FLUENCE ANG LE BEAM D #/ cm 2 deg mm TEMP deg C PART # Cross Section S/N SKT # Load (A) Vin (V) Transient Count + Threshold Transient Count - Threshold Comment 1 Au E E C IRHU3301A2AK Au E E C IRHU3301A2AK Au E E C IRHU3301A2AK Au E E C IRHU3301A2AK 86 1 INVALID RUN INVALID RUN INVALID RUN INVALID RUN 5 Au E E C IRHU3301A2AK 8.0E Au E E C IRHU3301A2AK 1.0E Au E E C IRHU3301A2AK 9.0E Au E E C IRHU3301A2AK 1.4E Au E E C IRHU3301A2AK 5.4E Au E E C IRHU3301A2AK 1.30E Au E E C IRHU3301A2AK 1.20E Au E E C IRHU3301A2AK 3.0E Au E E C IRHU3301A2AK 1.00E Crawford St, Leominster, Ma Tel:

50 SEE Test Report IRUH3301A2AK December Au E E C IRHU3301A2AK Au E E >100C IRHU3301A2AK Au E E >100C IRHU3301A2AK 86 1 INVALID RUN INVALID RUN 17 Au E E >100C IRHU3301A2AK 1.4E Au E E >100C IRHU3301A2AK 86 1 INVALID RUN 19 Au E E >100C IRHU3301A2AK 3.0E Au E E >100C IRHU3301A2AK 5.50E Au E E >100C IRHU3301A2AK 97 2 INVALID RUN 22 Au E E >100C IRHU3301A2AK 2.0E Au E E >100C IRHU3301A2AK 4.7E Au E E >100C IRHU3301A2AK 7.0E Au E E >100C IRHU3301A2AK 87 3 INVALID RUN 26 Au E E >100C IRHU3301A2AK 2.6E Au E E >100C IRHU3301A2AK 3.8E Au E E >100C IRHU3301A2AK 1.6E Au E E >100C IRHU3301A2AK 2.0E Au E E >100C IRHU3301A2AK Au E E >100C IRHU3301A2AK 1.2E Crawford St, Leominster, Ma Tel:

51 SEE Test Report IRUH3301A2AK December Au E E >100C IRHU3301A2AK Au E E >100C IRHU3301A2AK 2.0E Au E E >100C IRHU3301A2AK 3.0E Au E E >100C IRHU3301A2AK Au E E C IRHU3301A2AK 86 1 INVALID RUN Supply collapsed INVALID RUN 37 Au E E C IRHU3301A2AK 6.0E Au E E C IRHU3301A2AK 1.0E Au E E C IRHU3301A2AK 8.0E Au E E C IRHU3301A2AK 2.3E Au E E C IRHU3301A2AK 5.0E Au E E C IRHU3301A2AK 62 2 INVALID RUN 43 Au E E C IRHU3301A2AK 4.0E Au E E C IRHU3301A2AK 1.0E Au E E C IRHU3301A2AK 2.0E Au E E C IRHU3301A2AK 8.0E Au E E >100C IRHU3301A2AK INVALID RUN 48 Au E E >100C IRHU3301A2AK 7.0E Au E E >100C IRHU3301A2AK 4.0E Crawford St, Leominster, Ma Tel:

52 SEE Test Report IRUH3301A2AK December Au E E >100C IRHU3301A2AK 1.2E Au E E >100C IRHU3301A2AK 3.0E Au E E >100C IRHU3301A2AK 28 3 INVALID RUN 53 Au E E >100C IRHU3301A2AK 1.4E Au E E >100C IRHU3301A2AK 1.0E Au E E >100C IRHU3301A2AK 1.0E Au E E >100C IRHU3301A2AK 1.1E Au E E >100C IRHU3301A2AK 43 1 INVALID RUN 58 Au E E >100C IRHU3301A2AK Au E E >100C IRHU3301A2AK Au E E >100C IRHU3301A2AK 4.0E Au E E >100C IRHU3301A2AK 1.1E Au E E >100C IRHU3301A2AK 43 1 INVALID RUN 63 Au E E >100C IRHU3301A2AK 6.0E Au E E >100C IRHU3301A2AK 8.0E Au E E >100C IRHU3301A2AK 1.0E Au E E >100C IRHU3301A2AK 1.2E Kr E E >100C IRHU3301A2AK 2.0E Crawford St, Leominster, Ma Tel:

53 SEE Test Report IRUH3301A2AK December Kr E E >100C IRHU3301A2AK 9.0E Kr E E >100C IRHU3301A2AK 1.0E Kr E E >100C IRHU3301A2AK 7.0E Kr E E >100C IRHU3301A2AK 2.0E Kr E E >100C IRHU3301A2AK 1.7E Kr E E >100C IRHU3301A2AK 1.1E Kr E E >100C IRHU3301A2AK 9.0E Kr E E >100C IRHU3301A2AK 3.0E Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 43 1 INVALID RUN 78 Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 6.0E Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 3.0E Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 1.0E Kr E E >100C IRHU3301A2AK 4.0E Kr E E >100C IRHU3301A2AK 86 1 INVALID RUN 205 Crawford St, Leominster, Ma Tel:

54 SEE Test Report IRUH3301A2AK December Kr E E >100C IRHU3301A2AK 1.0E Kr E E >100C IRHU3301A2AK 2.0E Kr E E >100C IRHU3301A2AK 1.0E Kr E E >100C IRHU3301A2AK Kr E E >100C IRHU3301A2AK 1.0E Kr E E >100C IRHU3301A2AK 1.0E Kr E E >100C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 1.0E Kr E E C IRHU3301A2AK 7.0E Kr E E C IRHU3301A2AK 9.0E Kr E E C IRHU3301A2AK 2.0E Kr E E C IRHU3301A2AK Kr E E C IRHU3301A2AK 9.0E Xe E E >100C IRHU3301A2AK 7.0E Xe E E >100C IRHU3301A2AK INVALID RUN 103 Xe E E >100C IRHU3301A2AK 1.0E Crawford St, Leominster, Ma Tel:

55 SEE Test Report IRUH3301A2AK December Xe E E >100C IRHU3301A2AK 4.0E Xe E E >100C IRHU3301A2AK 1.0E Xe E E >100C IRHU3301A2AK 1.0E Xe E E >100C IRHU3301A2AK 1.0E Xe E E >100C IRHU3301A2AK 5.0E Xe E E >100C IRHU3301A2AK 1.0E Xe E E C IRHU3301A2AK 3.0E Xe E E C IRHU3301A2AK 1.0E Xe E E C IRHU3301A2AK 3.0E Xe E E C IRHU3301A2AK 4.0E Xe E E C IRHU3301A2AK 3.0E Xe E E C IRHU3301A2AK 1.2E Xe E E C IRHU3301A2AK 2.0E Xe E E C IRHU3301A2AK 4.0E Xe E E C IRHU3301A2AK Xe E E C IRHU3301A2AK Xe E E C IRHU3301A2AK Shutter experiment Shutter experiment Shutter experiment 205 Crawford St, Leominster, Ma Tel:

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