LABORATORY LOCATION: (PERMANENT LABORATORY) MITUTOYO (M) SDN. BHD. MAH SING INTEGRATED INDUSTRIAL PARK BANDAR PINGGIRAN SUBANG 4, JALAN UTARID U5/14, SECTION U5 40150 SHAH ALAM SELANGOR, MALAYSIA Page: 1 of 5 This laboratory accredited under Skim Akreditasi Makmal Malaysia (SAMM) meets the requirements of :2005 General requirements for competence of testing and calibration laboratories. This Malaysian Standards is identical with ISO/IEC 17025:2005 published by the International Organization for Standardization (ISO). * The expanded uncertainties are based on an estimated confidence probability of approximately 95% and have a coverage factor of k=2 unless stated otherwise. Instrument / External micrometer 25, 50 and 100 frame Caliper Capability 25 travel 0.6 m using ceramic gauge block MICP/0002 Rev2.2 (JIS B7502:1994) Up to 300 300 to 600 600 to 1000 0.0005 inch to 12 inch 6.5 m 9.2 m 25 m using MICP/0001 Rev2.2 (JIS B7507:1993) 0.0005 inch using MICP/0010 Rev1.0 Height gauge 0.01 to 600 10 m using MICP/0003 Rev2.2 (JIS B7517:1993) as a
Page: 2 of 5 Instrument / Capability Expressed as Dial gauge 0.001 to 10 0.6 m using I checker MICP/0004 Rev2.3 (JIS B7503:2011) Gauge block 0.5 to 15 15 to 25 25 to 50 50 to 75 70 to 100 0.04 m 0.05 m 0.07 m 0.09 m 0.12 m MICP/0007 Rev1.0 to JIS B 7506:2004 Dial test indicator 0.001 to 1 0.6 m using I checker MICP/0005 Rev2.3 (JIS B7533:1990) Digimatic indicator 0.001 to 100 0.6 m using I checker MICP/0006 Rev1.0 Holtest & Borematic Setting Rod 4 to 175 175 to 200 25 to 200 2.8 m 4.0 m 3.2 m using standard ring gauge to MICP/0008 revision 1.0 (Mitutoyo in house using precision height gauge to MICP/0011 Rev 1.0
Page: 3 of 5 Instrument / Contact Type Coordinate Measuring Machine Non-contact Type Coordinate Measuring Machine X Axis : 0 to 700 Y Axis : 0 to 700 Z Axis : 0 to 700 X Axis : 700 to 1000 Y Axis : 700 to 1000 Z Axis : 700 to 1000 X Axis : 1000 to 1200 Y Axis : 1000 to 2000 Z Axis : 1000 to 1000 X Axis : 0 to 800 Y Axis : 0 to 800 Z Axis : 0 to 200 Capability 1.2 m Method-1 MOCP/001 Rev2.0 to JIS B7440:1987 & JIS7440-2:1997 as a 1.5 m to Method 2 MOCP/011 Rev1.0 to ISO 10360-2:2009, ISO 10360-5:2010 & ISO 10360-4:2000 as a 6.8 m to MOCP/011 Rev3.0 ISO 10360-2:2009, ISO 10360-5:2010 & ISO 10360-4:2000 as a 6.1 m MOCP/002 Rev2.0 Manufacturer s (Mitutoyo) Specification (in house procedures 1/98) Profile Projector X Axis : 0 to 200 Y Axis : 0 to 200 Toolmaker Microscope Contour testing Machine X Axis : 0 to 200 Y Axis : 0 to 200 X Axis : 0 to 100 25 to +25 4 m MOCP/003Rev2.0 (JIS B7184:1999) as a 3 m MOCP/004 Rev2.0 (JIS B7153:1995) as a X axis : 0.4 m Z axis : 0.1 m MOCP/006 Rev2.0 Manufacturer s (Mitutoyo)
Page: 4 of 5 Specification (in house procedures 3/98) Instrument / Linear Height X Axis : - Z Axis : 0 to 1000 Surface Roughness Testing Roundness measuring Machine 300 µm to +300 µm X Axis : -400 µm to +400 µm 400 µm to +400 µm Capability X axis : - Z axis : 8.0 m Method-1 MOCP/001 Rev2.0 to JIS B7440:1987 & JIS7440-2:1997 as a Guide 0.2 m MOCP/005 Rev2.0 (JIS B0651:2001) as a X Axis : 0.1 µm Y Axis : 0.1 µm MOCP/007 Rev2.0 (JIS B7451:1997) as a
Page: 5 of 5 HARDNESS Instrument / Hardness tester Rockwell scale 30 to 35 HRB 90 to 95 HRB 30 to 35 HRC 45 to 50 HRC 60 to 65 HRC Rockwell superficial scale 52 to 57 HR 30N 65 to 70 HR 30N 77 to 82 HR 30N 35 to 40 HR 30T 73 to 78 HR 30R Vickers scale 200HV10 300HV10 500HV10 500HV1 700HV30 Capability 1.0 HRB 1.0 HRB 2.0 HR 30T 1.0 HR 30T 3 HV 3 HV 7 HV to MOCP/009 B7726:2010) to MOCP/009 B7726:2010) to MOCP/010 B7725:2010) Micro Vickers 200HV0.1 500HV1 500HV0.1 300HV0.2 700HV0.2 8 HV 28 HV 12 HV 36 HV to MOCP/010 B7725:2010)