Thermal Characterization and Modeling: a key part of the total packaging solution. Dr. Roger Emigh STATS ChipPAC Tempe, AZ

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Thermal Characterization and Modeling: a key part of the total packaging solution Dr. Roger Emigh STATS ChipPAC Tempe, AZ

Outline: Introduction Semiconductor Package Thermal Behavior Heat Flow Path Stacked Die and SiP/MCM Early Thermal Simulation Simplified Package Models System Level Design Using Compact Models Other Thermal Challenges To Watch For Summary

Introduction: Anything can be cooled for a price Packaging solutions must meet several requirements Mechanical, Electrical, and Thermal Finding the best thermal packaging solution among those available meets thermal requirements (and all the others) lowest cost reliable/high volume capable Early Simulation Make changes early, avoid costly design rework and/or tooling costs Must consider full thermal picture, from die to system

Semiconductor Package Thermal Behavior Initial package selection places limits on thermal capabilities How easily can the heat move away from the die and spread to a larger area? Once heat has moved away from the die vicinity, are there enough low resistance paths to get it out of the package? Does the package respond well to addition of heat sink or other cooling enhancements? Understanding the overall thermal requirements and using early simulation allows best initial selection of package family.

Semiconductor Package Thermal Behavior Local Issues Die size, power density, interconnection, Materials in contact with die Package Issues Lead/Ball count, size constraints, layers, thermal enhancements (drop-in spreaders, exposed pads, thicker copper layers,...) Global Issues Environment- airflow and ambient temperature Enclosure- overall size, vents, fans, other heat sources

Semiconductor Package Thermal Behavior: Materials Die Attach- thickness, conductivity (be cautious of manufacturers data) Soldermask adds significant thermal resistance in low resistance packages and those with high power density openings can help thermally but can also effect reliability Molding Compound usually not to important unless the key heat flow path includes it Drop-in Heat Spreaders heat must pass through mold compound to enter spreader most effective for smaller die in large package very good for 2 layer array packages with otherwise poor heat spreading in x-y directions

Semiconductor Package Thermal Behavior: Key Heat Flow Paths Understanding heat flow paths allows correct thermal structure models that maintain thermal flow Software monitors heat flow across user defined planes TBGA package Heat Flow Monitor Planes JEDEC 2S2P PCB

Semiconductor Package Thermal Behavior: Key Heat Flow Paths PBGA- individual molded matrix molded PBGA-Heat Spreader enhanced x-y spreading Exposed Pad Lead-Frame Based direct thermal path to PCB

Semiconductor Package Thermal Behavior: Key Heat Flow Paths Flip chip PBGA- Wire Bonded EBGA Both of these respond well to heat sink addition

Stacked Die and SiP/MCM Systems Added geometric complexity No modeling problems when full geometry is used Potential change in critical heat flow path Effect on thermals varies can be good or bad... Same size die stack, poor conductivity spacer between No problem if top die is low power Big problem if top die is high power 9x9mm PBGA with side-by-side Die Lots of die area to move heat down, which is good for overall thermal resistance But if enough power is added to the package, it can still get too hot.

Early Thermal Simulation Initial Project Design Details Package Type Size, layers, materials, etc. Die Size and Power Solder Balls PCB Simplified Package Model Correlated with test database Thermal Package Screening Verify size, type, and construction details Example PBGA- size and ball array 4 layers 2oz inner planes Soldermask openings under die Back spreader on M4 Complete Design Work Refine Simplified Package Model actual design add some system details Convert to Compact Model full system design Ideally, the same modeling approach can be carried through entire process, from feasibility to system design

Early Thermal Simulation Simplified Package Model- Still a detailed 3D model but not an exact copy of the geometry or design Several ways to accomplish this- Limited design information through to Full design Good accuracy at first, better as design details are confirmed Full 3D geometric model, just simplified internal structures Initial work on JEDEC defined test board, moving to custom board if/when details become available Initial Goals: Narrow the range of packaging choices Eliminate those that will not work Early guidance if thermal additions are or might be required heat sinks, PCB vias, cold plates, etc...

Early Thermal Simulation: Large 4 Layer PBGA Example Top Metal Layer 30% (k = 120 W/mK) 0% 40% 100% (k=400 W/mK) 50% Die Flag

Early Thermal Simulation: Inner Planes H Signal vias: do not connect to M2 plane reduce their conductivity 70% 90% 70% 100% (Vias connect to M2 plane) Thermal vias: connect to M2 plane

Early Thermal Simulation: Solderballs and Vias H If no design information is available, assume 1 via per solder ball Solder balls: 0.5mm diameter = 0.44mm square Vias: 0.15mm diameter = 0.133mm square

Early Thermal Simulation: Summary Side view of simplified package model Focus on important heat flow paths Compare results to test data on similar structures Make conservative compromises when minimal design information is available Θja error goals/results: pre-design: -0% to +20% design available: -0% to +10% design and package structure (actual part cut-up): -0% to +5%

System Level Design: Compact Package Models Much larger modeling domain full PCB boards many packages/devices fans enclosure/vents Even simplified package models contain too much geometrical details Move to a Delphi type compact model Resistor network Boundary Condition Independent

System Level Design: Compact Package Models Convert Accurate Package model to a resistor network Optimize resistors and block sizes to obtain best fit based on a matrix of 44 sets of boundary conditions. Side Heat Transfer at boundaries in W/m2 5, 1, 5, 100 5, 10, 5, 1000 5, 50, 5, 1000 5, 50, 5, 4000 5, 100, 5, 1000 5, 100, 5, 500 15, 1, 15, 100 15, 10, 15, 1000 15, 50, 15, 1000 15, 50, 15, 4000 15, 100, 15, 1000 15, 100, 15, 500 30, 5, 30, 500 30, 30, 30, 3000 30, 200, 30, 10000 30, 500, 30, 2000 80, 5, 8, 500 80, 30, 30, 3000 80, 200, 8, 10000 80, 500, 8, 2000 200, 5, 20, 500 200, 30, 20, 3000 200, 200, 20, 10000 200, 500, 20, 2000 25, 1, 5, 100 25, 10, 5, 1000 25, 50, 5, 1000 25, 50, 5, 4000 25, 100, 5, 1000 25, 100, 5, 500 75, 1, 15, 100 75, 10, 15, 1000 75, 50, 15, 1000 75, 50, 15, 4000 75, 100, 15, 1000 75, 100, 15, 500 150, 5, 30, 500 150, 30, 30, 3000 150, 500, 30, 2000 150, 200, 30, 10000 500, 5, 20, 500 500, 500, 20, 2000 500, 30, 20, 3000 500, 200, 20, 10000

System Level Design: Compact Package Models Example Simplified Package Model: PBGA with Heat Spreader: Compact Model: Top Outer Top Inner Top Outer Side Die Block Side Bottom Outer Bottom Inner Bottom Outer Outer Balls Center Balls Outer Balls Blocks are connected by thermal resistors ( o C/W)

System Level Design: Detailed versus Compact results Example Resistor Network Top Inner Bottom Inner Top Outer Bottom Outer Side Junction 5.02 6.81 6.21 108.02 Infinity Top Inner 24.74 Infinity Infinity Infinity Bottom Inner Infinity 14.86 134.82 Top Outer 1.54 3.46 Bottom Outer Infinity Side Power (W) PCB Size (mm) PCB Layers PCB Copper (M1 & M6) PCB Via Block Heat Sink Θ JA ( o C/W) Detailed Θ JA ( o C/W) Compact % error 5.2 60 x 95 6L 60% Yes No 9.80 9.75 0.5 % 5.2 62 x 93 6L 60% Yes Yes 8.85 8.75 1.4 % 3.0 JEDEC 4L 20% No No 11.45 11.25 1.7 %

System Level Design: Large PCB Example 4 PBGA packages with heat sinks, forced convection: 1 m/s 32 Exposed Pad No Lead Packages, all with PCB vias 200mm x 360mm 10 layer PCB

System Level Design: Large PCB Example Using simplified models >1M grid cells

System Level Design: Large PCB Example Using compact models <200K grid cells

Other Thermal Challenges To Watch For Increased Ambient Temperatures 40 o C (desktop/telecom), 70 o C, 85 o C, 105 o C (automotive) With a 125 o C Tj limit, these give available die temperature increases of: 85 o C, 55 o C, 40 o C, and 20 o C Reduced Junction Maximum Temperatures 105 o C can totally change overall approach Increased Total System Power Dissipation Transition from passive to active heat removal Significant cost issue for some systems, can be a show stopper Die Size Reductions Smaller die size with same power gives an increased power density Everything thermal gets more difficult

Summary Consider Thermal as early as possible keep maximum options open Use Simulation early in the process no need to wait for exact design details Select Package type carefully don t get trapped in the wrong package family Extend Simulation through to final system design Simplified package models using full geometry can go far Compact Delphi models for the most challenging systems