LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only ROUND TYPE LED LAMPS. Lead-Free Parts LDUV2043Z/A DATA SHEET REV.

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ROUND TYPE LED LAMPS Pb Lead-Free Parts LDUV2043Z/A DATA SHEET DOC. NO : QW0905-LDUV2043Z/A REV. : A DATE : 14- Mar. - 2017 發行 立碁電子 DCC

Page 1/6 Package Dimensions 3.0 4.0 4.2 5.2 1.5MAX 25.0MIN 0.5 TYP Zener 2.54TYP 1.0MIN + DUV - Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation -30 0 30-60 60 100% 75% 50% 25% 0 25% 50% 75% 100%

Page 2/6 Absolute Maximum Ratings at Ta=25 Parameter Symbol Ratings DUV UNIT Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Reverse Current @5V IF IFP PD Ir 30 ma 100 ma 120 mw 50 μa Electrostatic Discharge( * ) ESD 500 V Operating Temperature Topr -20 ~ +80 Storage Temperature Tstg -30 ~ +100 Typical Electrical & Optical Characteristics (Ta=25 ) PART NO MATERIAL COLOR Peak wave length λpnm Spectral halfwidth λnm Forward voltage @20mA(V) Luminous intensity @20mA(mcd) Viewing angle 2θ 1/2 (deg) Emitted Lens Min. Max. Min. Typ. LDUV2043Z/A InGaN Purple Water Clear 400 20 3.0 4.0 160 300 30 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance.

Page 3/6 Brightness Code For Standard LED Lamps DUV CHIP Group Luminous Intensity(mcd) at 20 ma Min. Max. A14 160 220 A15 A16 220 300 300 350 A17 350 450 A18 450 550

Page 4/6 Typical Electro-Optical Characteristics Curve DUV CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vsforward Current 3.9 2.5 3.8 3.7 2.0 Forward Voltage(V) 3.6 3.5 3.4 3.3 3.2 Relative Intensity Normalize @20mA 1.5 1.0 0.5 3.1 20 30 40 50 60 70 80 90 100 0 20 30 40 50 60 70 80 90 100 Forward Current(mA) Forward Current(mA) Fig.3 Forward Current vs. Wavelength Fig.4 Relative Intensity vs. Wavelength Wavelength(nm)WLP 420 410 400 390 380 20 40 60 Relative Intensity@20mA 1.0 0.5 0.0 80 100 350 400 450 550 Forward Current(mA) Wavelength (nm)

Page 5/6 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350 C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile Dip Soldering Preheat: 120 C Max Preheat time: 60seconds Max Ramp-up 2 C/sec(max) Ramp-Down:-5 C/sec(max) Solder Bath:260 C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) Temp( C) 260 260 C3sec Max 5 /sec max 120 25 0 2 /sec max 0 Preheat 50 60 Seconds Max 100 150 Time(sec) Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above.

Page 6/6 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ±5 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ±5 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. JIS C 7021: B-12 High Temperature High Humidity Test 1.Ta=65 ±5 2.RH=90%~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hours. MIL-STD-202:103B JIS C 7021: B-11 Thermal Shock Test 1.Ta=105 ±5 &-40 ±5 (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ±5 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=245 ±5 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2

PACKING SPECIFICATION 1.1000 PCS / BAG 2. 8 BAG / INNER BOX SIZE : L X W X H 33.5cm X 19cm X 7.5cm W L H 3. 12 INNER BOXES / CARTON SIZE : L X W X H 58.5cm X 34cm X 34cm L W C/NO: MADE IN CHINA ITEM NO. Q'TY: PCS N,W,: kgs G,W,: kgs H