< C band internally matched power GaAs FET > MGFC45B3436B GHz BAND / 30W

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Transcription:

DESCRIPTION The is an internally impedance-matched GaAs power FET especially designed for use in 3.4 3.6 GHz band amplifiers. The hermetically sealed metal-ceramic package guarantees high reliability. FEATURES Class AB operation Internally matched to 50(ohm) system High output power Po(SAT)=30W (TYP.) @f=3.4 3.6GHz High power gain GLP=11.0dB (TYP.) @f=3.4 3.6GHz Distortion ACP=-45dBc (TYP.) @f=3.4 3.6GHz RECOMMENDED BIAS CONDITIONS VDS=12V ID=0.8A RG=12ohm Absolute maximum ratings (Ta=25 C) Symbol Parameter Ratings Unit VGDO Gate to drain breakdown voltage -15 V VGSO Gate to source breakdown voltage -10 V MAXID Maximum drain current 10 A PT *1 Total power dissipation 78 W Tch Cannel temperature 175 C Tstg Storage temperature -65 to +175 C *1 : Tc=25 C Electrical characteristics (Ta=25 C) Symbol Parameter Test conditions Limits Unit Min. Typ. Max. VGS(off) Gate to source cut-off voltage VDS=3V,ID=100mA -0.5 - -3.0 V Po(SAT) Output Power VDS=12V,ID(RF off)=0.8a f=3.4-3.6ghz Keep Safety first in your circuit designs! Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measure such as (I) placement of substitutive, auxiliary circuits, (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap. - 45 - dbm GLP Linear Power Gain VDS=12V,ID(RF off)=0.8a 10 11 - db ID Drain current f=3.4-3.6ghz,pout=34dbm - 1.2 1.5 A ACP *2 Adjacent Channel leakage Power - -45 - dbc Rth(ch-c) *3 Thermal resistance delta Vf method - - 1.9 C/W *2 :Mod.3GPP TEST MODEL 1 64code Signal *3 :Channel-case 1

TYPICAL CHARACTERISTICS 2

S-parameters( Ta=25deg.C, VDS=12(V),IDS=0.8(A) ) 3

S-parameters( Ta=25deg.C, VDS=12(V),IDS=0.8(A) ) 4

RF TEST FIXTURE 5

Keep safety first in your circuit designs! Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials These materials are intended as a reference to assist our customers in the selection of the Mitsubishi semiconductor product best suited to the customer s application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Mitsubishi Electric Corporation or a third party. Mitsubishi Electric Corporation assumes no responsibility for any damage, or infringement of any third-party s rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Mitsubishi Electric Corporation without notice due to product improvements or other reasons. It is therefore recommended that customers contact Mitsubishi Electric Corporation or an authorized Mitsubishi Semiconductor product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. Mitsubishi Electric Corporation assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information published by Mitsubishi Electric Corporation by various means, including the Mitsubishi Semiconductor home page (http://www.mitsubishielectric.com/). When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the information and products. Mitsubishi Electric Corporation assumes no responsibility for any damage, liability or other loss resulting from the information contained herein. Mitsubishi Electric Corporation semiconductors are not designed or manufactured for use in a device or system that is used under circumstances in which human life is potentially at stake. Please contact Mitsubishi Electric Corporation or an authorized Mitsubishi Semiconductor product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. The prior written approval of Mitsubishi Electric Corporation is necessary to reprint or reproduce in whole or in part these materials. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or re-export contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. Please contact Mitsubishi Electric Corporation or an authorized Mitsubishi Semiconductor product distributor for further details on these materials or the products contained therein. 2011 MITSUBISHI ELECTRIC CORPORATION. ALL RIGHTS RESERVED. 6