IESNA LM-79: Measurement and Test Report for EIKO GLOBAL, LLC W 84th St, Shawnee, KS Nov 09, 2015 LED100WPT50KMOG-G6

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1 IESNA LM-79: 28 Measurement and Test Report for EIKO GLOBAL, LLC 2322 W 84th St, Shawnee, KS Nov 9, 215 Product Name: Model No: LED HID REPLACEMENT LED1WPT5KMOG-G6 Test Engineer: David Zhang Report No.: BTR Sample Received Date: Nov 4, 215 Test Performed Date: Nov 4, 215 to Nov 9, 215 Reviewed By: Prepared By: Steven Hsu BEST Test Service Shenzhen Co., Ltd. 1st Floor, 1st Building, Weitai Industrial Park, Yingrenshi, Shiyan, Baoan, Shenzhen, China TEL: FAX: certification@bestcert.cn Note: This report is not valid as a BEST Test Report unless signed by an approved BEST Test Service Shenzhen Co., Ltd. This report shall not be reproduced except in full w ithout the written approval of the testing laboratory. The test report only allows to be revised within the retention period unless further standard or the requirement was noticed. This report is for the exclusive use of BEST s Client and is provided pursuant to the agreement between BEST and its Client. BEST s responsibility and Liability are limited to the terms and conditions of the agreement. BEST assumes no liability to any party, other than to the Client in accordance with the agreement, for any loss, expense or damage occasioned by the use of this report. Only the Client is authorized to permit copying or distribution of this report and then only in its entirety. Any use of the BEST name or one of its marks for the sale or adver tisement of the tested material, product or service must first be approved in writing by BEST. The observations and test results in this report are relevant only to the sample tested. This report by itself does not cover that the material, product, of service is or has ever been under a BEST certification program. National Voluntary Laboratory Accreditation Program (NVLAP) has accredited this laboratory under ISO1725: 25 for specific laboratory activities as listed in the NVLAP directory of accredited laboratories. The results shown in this report were determined by this laboratory in accordance with its terms of accreditation. This report must not be used by the client to claim product endorsement by NVLAP, NIST or any agency of the U.S. Government.

2 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 TABLE OF CONT ENTS 1 - GENERAL INFORMATION PRODUCT DESCRIPTION FOR EQUIPMENT UNDER TEST (EUT) OBJECTIVE TEST FACIL ITY DESCRIPTION TEST EQUIPMENT LIST TEST METHOD PHOTOMETRIC AND ELECTRICAL MEASUREMENT (INTEGRATED SPHERE METHOD) PHOTOMETRIC AND ELECTRICAL MEASUREMENT (GONIOPHOTOMETER METHOD) DEVIATION FROM STANDARD OPERATING PROCEDURE SUMMARY OF TEST RESULT SPECTRAL FLUX PLOTS EUT PHOTOS LUMINOUS INTENSITY DISTRIBUTION TEST PLOTS (CIE CHROMATICITY)... 9 Report No.BTR Page 2 of 9 IESNA LM-79 Test Report

3 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 1 - GENERAL INFORMATION 1.1 Product Description for Equipment under Test (EUT) Applicant : EIKO GLOBAL, LLC Product Name : LED HID REPLACEMENT Model No : LED1WPT5KMOG-G6 Brand : EIKO Nominal Operation Voltage : AC 1-277V Nominal Power : 1W Nominal CCT : 5K Nominal CRI : >8 Nominal Lumen Output : 119Lumens Nominal Life Time : 5Hours Number of hours operated prior to measurement for new sample : Hours Stabilization Time : 1.5 hours Total operating time for measurement include stabilization time : 3.5 hours Date of Receiving Sample : Nov 4, 215 Measurement quantities measured : 1 pcs Orientation During Testing : Base up Test Requested : Electrical and Photometric Test Luminous Intensity Distribution Test THD 1.2 Objective The following test report is prepared on behalf of EIKO GLOBAL, LLC in accordance with IESNA LM-79-8, used the following American National Standards or illumination Engineering Society of North America test guides: ANSI C : Specifications for the Chromaticity of Solid State Lighting Products ; ANSI C : American National Standard for Electric Lamps Nomenclature for Glass Bulbs Intended for Use with Electric Lamps; ANSI C : American National Standard for Electric Lamps A, G, PS, and Similar Shapes with E26 Medium Screw Bases; ANSI C : American National Standard for Electric Lamps PAR and R Shapes; ANSI C : American National Standard for Electric Lamps Two-inch (51 mm); Integral-reflector Lamps with Front Covers and GU5.3 or GX 5.3 Bases; ANSI/IEC C : American National Standard for Electric Lamp Bases ; ANSI/IEEE C (1-May-1991): Surge Voltages in Low-Voltage AC Power Circuits, Recommended Practice for; CIE Publication No : Method of Measuring and Specifying Color Rendering of Light Sources; CIE Publication No : The Basis of Physical Photometry; IESNA LM : Practical Guide to Colorimetry of Light Sources; IESNA LM : Guide for the Selection, Care, and Use of Electrical Instruments in the Photometric Laboratory; IESNA LM-79-8 Electrical and Photometric Measurement of Solid State Lighting Products UL : Standard for Self-Ballasted Lamps and Lamp Adapters; UL : Light Emitting Diode (LED) Equipment for Use in Lighting Products. 1.3 Test Facility Description The Energy Efficiency Lab used by BEST to collect energy efficiency measurement data is located in 1st Floor, 1st Building, Weitai Industrial Park, Yingrenshi, Shiyan, Baoan, Shenzhen, China. BEST Test Service Shenzhen Co., Ltd Report No.BTR Page 3 of 9 IESNA LM-79 Test Report

4 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 is a National Institute of Standards and Technology (NIST) accredited laboratory, under the National Voluntary Laboratory Accredited Program (Lab Code 277-). BEST Test Service Shenzhen Co., Ltd is also an ELI accredited lab for lighting products (ELI Certificate No. ELI-L4-21) and UL accredited lab for lighting products 1.4 Test Equipment List Apparatus List Device Cal. Date Cal Due Date 1 Integral Sphere+ Spectrophotometer System Mar 1, 215 Mar 9, Digital Power Meter Oct 18, 215 Oct 17, Goniophotometer+ Spectrophotometer System Nov 2, 214 Nov 19, Standard Light Source Sep 17, 215 Sep 16, Standard Light Source Sep 17, 215 Sep 16, Digital Storage Oscilloscope Oct 18, 215 Oct 17, Ultra Compact Simulator Oct 2, 215 Oct 19, Temperature Chamber Oct 2, 215 Oct 19, Digital Caliper Nov 2, 214 Nov 19, Digital CC&CV DC Power Supply(3V 5A) N/A N/A /2 Digital Multimeter Oct 18, 215 Oct 17, Digital CC&CV DC Power Supply(12V 1A) N/A N/A /2 Digital Multimeter Oct 18, 215 Oct 17, Digital Multimeter Oct 18, 215 Oct 17, Temperature Recorder+Thermocouple Nov 2, 214 Nov 19, Timer Controller Nov 2, 214 Nov 19, 215 Statement of Traceability: BEST Test Service Shenzhen Co., Ltd. certifies that all calibration has been performed using suitable standards traceable to the NIM China. Report No.BTR Page 4 of 9 IESNA LM-79 Test Report

5 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 2 - Test Method 2.1 Photometric and Electrical Measurement (Integrated Sphere Method) Total light output (luminous flux) for the 25 1 ambient temperature conditions is measured using a 1.6m 4 geometry integrating sphere. Temperature is measured at a position inside the sphere. Spectral radiant flux measurements are made using Lab sphere to the detector port of the integrating s phere. Each lamp is operated at rated voltage in its designated orientation. Each lamp should be stable before measurements are made. The determining method of stable is as follows: Step 1 Take 3 measurements of the lamp light output at 15 minute interval (total time=3mintues.)this time period is in addition to the recommended pre-burning time. Step 2 Calculate the percent difference between the maximum measured value and the minimum measured value for the three consecutive measurements. Step 3 if the value calculated in Step 2 does not exceed.5 percent, the lamp is considered stable. Luminous flux, chromaticity coordinates, correlated color temperature and color rendering index for each lamp are calculated from the spectral radiant flux measurements taken at 2 nm intervals over the range 35 to 15 nm. The calibration of the sphere photometer-spectrometer system is traceable to the NIST USA. Lamp efficacy (lumens per watts) for each lamp model is computed based on the revised luminous flux result. El ectrical measurements including voltage, current, power and power factor are measured using the digital power Meter. The total uncertainty of the light output measurements is estimated, at the 95% confidence level, not to exceed ±1.12% over the wavelength range nm. 2.2 Photometric and Electrical Measurement (GonioPhotometer Method) A Goniometer was used to measure the intensity (candelas) at each angle of distribution for each sample; the photometric distance is 24m. Ambient temperature was measured equal to the height of the sample mounted on the Goniometer equipment. Each sample was operated at input rated voltage in its designated orientation. Each sample was allowed to be stable before measurement was made. Electrical measurements including voltage, current, power and power factor were measured using the Power Analyzer Before each measurement, the method below should be used to determine the lamp is stable or not. Step 1 Take 3 measurements of the lamp intensity at 15 minute interval (tota l time=3mintues.)this time period is in addition to the recommended pre-burning time. Step 2 Calculate the percent difference between the maximum measured value and the minimum measured value for the three consecutive measurements. Step 3 if the value calculated in Step 2 does not exceed.5 percent, the lamp is considered stable. Some graphics were created with Photometric Plus software. 2.3 Deviation from standard operating procedure None. Report No.BTR Page 5 of 9 IESNA LM-79 Test Report

6 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 3 Summary of Test Result Item Test Result Accreditation ITHD 8.3% NVLAP/EPA Required Fields Lumen Output (Lumens) Luminous Efficacy (lm/w) Correlated Color Temperature (CCT) NVLAP/EPA NVLAP/EPA 5213 NVLAP/EPA Color Rendering Index CRI 85.6 NVLAP/EPA Input Power (W) NVLAP/EPA Power Type AC DC / Input Voltage (V) Input Current (A) 12. NVLAP/EPA.8338 NVLAP/EPA Power Factor.995 NVLAP/EPA x(cie 1931).3385 NVLAP/EPA y(cie 1931).3399 NVLAP/EPA u (CIE 1976).2115 NVLAP/EPA Optional Fields v (CIE 1976).4778 NVLAP/EPA Duv(CIE 1976) -.44 NVLAP/EPA R9 25 NVLAP/EPA Beam Angle: (Degree) Center beam candlepower: (cd) 33.2 NVLAP/EPA 1246 NVLAP/EPA Zonal lumen density (-6 ): 26.7% NVLAP /EPA Zonal lumen density (6-9 ): 31.% NVLAP /EPA Zonal lumen density (9-12 ): 28.1% NVLAP /EPA Zonal lumen density (12-18 ): 14.2% NVLAP /EPA Report No.BTR Page 6 of 9 IESNA LM-79 Test Report

7 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 4 Spectral Flux Plots Report No.BTR Page 7 of 9 IESNA LM-79 Test Report

8 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 5 EUT Photos Report No.BTR Page 8 of 9 IESNA LM-79 Test Report

9 EIKO GLOBAL, LLC Model: LED1WPT5KMOG-G6 6 Luminous Intensity Distribution Test Plots (CIE Chromaticity) This page is blank and see next page. Report No.BTR Page 9 of 9 IESNA LM-79 Test Report

10 BEST TEST SERVICE SHENZHEN CO.,LTD Page 1 Of 14 LUMINAIRE PHOTOMETRIC TEST REPORT Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: DATA OF LAMP PHOTOMETRIC DATA Eff: lm/w MODEL LED1WPT5KMOG-G6 Imax(cd) 1246 S/MH(C/18) 2.28 NOMINAL POWER(W) 1 LOR(%) 1. S/MH(C9/27) 2.28 RATED VOLTAGE(V) 12. TOTAL FLUX(lm) 1195 UP,DN(C-18) 2.9,28.9 NOMINAL FLUX(lm) 1195 CIE CLASS DIFFUSE UP,DN(C18-36) 21.4,28.8 LAMPS INSIDE 1 up(%) 42.3 CIBSE SHR NOM 2. TEST VOLTAGE(V) 12. down(%) 57.7 CIBSE SHR MAX. LUMINOUS INTENSITY DISTRIBUTION DIAGRAM S(m) PLANAR ISOLUX DIAGRAM(UNIT:lx) C(DEG) / UNIT:cd C/18,32.6deg C9/27,33.8deg AVERAGE BEAM ANGLE(5%):33.2 DEG MH=1m C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

11 BEST TEST SERVICE SHENZHEN CO.,LTD Page 2 Of 14 ZONAL FLUX DIAGRAM AND LUMINANCE LIMITATION CURVES ZONAL FLUX DIAGRAM: C C45 C9 C135 C18 C225 C27 C315 zone total %lum,lamp , , , , , , , , , , , , , , , , , ,1 DEG LUMINOUS INTENSITY:cd UNIT:lm G(DEG) 85 LUMINANCE LIMITATION CURVES GLARE CLASS ILLUMINANCE (lx) 1.15 A <=3 1.5 B <= C <=3 2.2 D <= E <=3 a b c d e f g h a b c d e f g h C/18 C9/27 LUMINANCE (cd/(m2)) a/h 2 LUMINANCE cd/(m2) G(DEG) C/18 C9/ C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

12 BEST TEST SERVICE SHENZHEN CO.,LTD Page 3 Of 14 CU AND LUMINAIRE BUDGETARY ESTIMATE DIAGRAM Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: cc w fc RCR % 7% 5% 3% 5% 3% 1% 5% 3% 1% 5% 3% 1% 5% 3% 1% 2% 2% 2% 2% RCR:Room Cavity Ratio Coefficients of Utilization(CU) % 5% 3% 1% 2% LAMPS 5 LUMINAIRE BUDGETARY DIAGRAM H=7 CONDITIONS 8 FLUX 5lm 7 6 FACTOR.7 6 Hdown.m 5 H=7 Hwork.m 5 4 Ework(AVE) 1lx 6 cc w fc k 2k 3k 4k 5k 7k AREA(m2) C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

13 BEST TEST SERVICE SHENZHEN CO.,LTD Page 4 Of 14 WEC AND CCEC Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: cc 8% 7% 5% 3% 1% w 5% 3% 1% 5% 3% 1% 5% 3% 1% 5% 3% 1% 5% 3% 1% fc 2% 2% 2% 2% 2% RCR RCR:Room Cavity Ratio Wall Exitance Coeffcients(WEC) cc w fc RCR % 7% 5% 3% 1% 5% 3% 1% 5% 3% 1% 5% 3% 1% 5% 3% 1% 5% 3% 1% 2% 2% 2% 2% 2% RCR:Room Cavity Ratio Ceiling Cavity Exitance Coefficients(CCEC) C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

14 BEST TEST SERVICE SHENZHEN CO.,LTD Page 5 Of 14 UGR(Unified Glare Rating) Table Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: ceiling/cavity walls working plane Room dimensions Viewed crosswise Viewed endwise x = 2H y = 2H 3H 4H 6H 8H 12H H 2H 3H 4H 6H 8H 12H H 4H 6H 8H 12H H 4H 6H 8H Variations with the observer position at spacings: S = 1.H +.1 / / H +.2 / / H +.3 / / -.4 CIE Pub.117 Corrected 1195 lm Total Lamp Luminous Flux.(8log(F/F) = 8.6) C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

15 BEST TEST SERVICE SHENZHEN CO.,LTD Page 6 Of 14 UTILIZATION FACTORS TABLE Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: REFLECTANCE Ceiling Walls Working plane ROOM INDEX UTILIZATION FACTORS(PERCENT) k(ri) x RCR = 5 k = ROOM INDEX UF(total) Direct According to DIN EN Suspended SHRNOM = 1.25 C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

16 BEST TEST SERVICE SHENZHEN CO.,LTD Page 7 Of 14 ISOCANDELA DIAGRAM Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: Conical surface Flux(9deg): lm %lum = 14.1% 9 %lamp = 14.1% 8 Conical surface Flux(12deg): lm %lum = 26.7% 6 %lamp = 26.7% 5 VERTICAL(DEG) % % % % % % % % % Imax:1246(H4.,V-56.5) (At:C=45.,Gamma=65.) UNIT: cd HORIZONTAL(DEG) C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

17 BEST TEST SERVICE SHENZHEN CO.,LTD Page 8 Of 14 AAI Figure Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: Flux out:1685 lm 3.281ft 1m 49.84,61.6fc 536.5,657.2lx 6.562ft 2.cm 6.562ft 2m 12.46,15.26fc 134.1,164.3lx 13.12ft 4.cm 9.843ft 3m 5.538,6.784fc 59.61,73.3lx 19.69ft 6.cm 13.12ft 4m 3.115,3.816fc 33.53,41.8lx 26.25ft 8.cm 16.4ft 5m 1.994,2.442fc 21.46,26.29lx 32.81ft 1.cm Height Eavg,Emax Angle:9.deg Diameter Note:The Curves indicate the illuminated area and the average illumination when the luminaire is at different distance. C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

18 BEST TEST SERVICE SHENZHEN CO.,LTD Page 9 Of 14 ISOLUX DIAGRAM Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: 11.9' 5.9'.' 5.9' 11.9' 127.3' 38.81m 11.9' 31.5m 76.4' 23.28m 3%.1971lx.1831fc 5%.3285lx.352fc 1%.657lx.614fc 3% 1.971lx.1831fc 5% 3.285lx.352fc 5.9' 15.52m 25.5' 7.76m.'.m 25.5' 7.76m 5.9' 15.52m 76.4' 23.28m 11.9' 31.5m 127.3' 38.81m 31.5m 15.52m.m 15.52m 31.5m MOUNTING HEIGHT: 33'(1.m) C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

19 BEST TEST SERVICE SHENZHEN CO.,LTD Page 1 Of 14 Planar Illuminance Curve E(lx) Planar Illuminance Curve MH = 1 m C/18 C9/ Distance(m) C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

20 BEST TEST SERVICE SHENZHEN CO.,LTD Page 11 Of 14 LUMINOUS DISTRIBUTION INTENSITY DATA Test:U:12.V I:.8338A P:99.12W PF:.995 Lamp Flux:1195x1 lm NAME: SPEC.: MFR.: EIKO GLOBAL, LLC TYPE:LED1WPT5KMOG-G6 DIM.: SUR.: WEIGHT: SERIAL No.: PROTECTION ANGLE: Table--1 C(DEG) (DEG) UNIT: cd C Range: - 36DEG C Interval: 22.5DEG Test Speed: HIGH Temperature:25.6DEG Operators:David Test Date: Range: - 18DEG Interval: 1.DEG Test System:EVERFINE GO-R5_V2 SYSTEM V Humidity:67.1% Test Distance:2.455m [K=1.] Remarks:

21 I(cd) ABAB

22 1 lm K = lx d/h 3 1 2

23 F = 5 lm K =.7 Hcc =. m Hfc =. m Eave = 1 lx Pcc Pw Pfc N H= H= S(m2)